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http://dx.doi.org/10.4313/JKEM.2007.20.3.197

The Aging Diagnostic Technology for Predicting Lifetime of Thyristor Devices  

Kim, Byung-Cheul (진주산업대학교 전자공학과)
Kim, Hyoung-Woo (한국전기연구원 전력반도체연구그룹)
Seo, Kil-Soo (한국전기연구원 전력반도체연구그룹)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.20, no.3, 2007 , pp. 197-201 More about this Journal
Abstract
The accelerated aging test equipment which is possible to apply voltage and temperature at the same time, is fabricated to predict lifetime of high capacity thyristor in short time. The variations of the forward/reverse breakdown voltage and the leakage current are investigated as an aging diagnostic tool. Lifetimes of the devices which are predicted from the reverse breakdown voltage with an accelerated aging time, have shown 3-15 years.
Keywords
Thyristor; Accelerated aging test equipment; Voltage; Temperature; Device lifetime;
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