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http://dx.doi.org/10.4313/JKEM.2006.19.6.586

A Basic Study on the Application of Partial Discharge Test on Low-voltage Electrical and Electronic Devices  

Kil Gyung-Suk (한국해양대학교 전기전자공학부)
Song Jae-Yong (한국해양대학교 전기전자공학부)
Moon Seung-Bo (한국해양대학교 전기전자공학부)
Cha Myung-Soo (한국해양대학교 전기전자공학부)
Hwang Don-Ha (한국전기연구원 전력설비진단연구그룹)
Kang Dong-Sik (한국전기연구원 전력설비진단연구그룹)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.19, no.6, 2006 , pp. 586-590 More about this Journal
Abstract
This paper deals with the application of a partial discharge (PD) test on low-voltage electrical and electronic devices, which is recently being accepted as a non-destructive and a effective dielectric test method. A comparative analysis combined with the Withstand Voltage Test (WVT) specified in IEC standards was carried out on low-voltage insulation transformers. The results showed that the WVT causes insulation degradation of the specimen during the test by applying high voltage. However, the PD test can be performed in ranges from 30 % to 50 % of the test voltage specified in the WVT. Therefore, the PD test is successfully applicable for a non-destructive test method on low-voltage electrical and electronic devices as a replacement of the WVT.
Keywords
Partial discharge; Dielectric test; Withstand voltage test; Insulation degradation; Apparent charge;
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