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http://dx.doi.org/10.4313/JKEM.2006.19.4.362

Electrical Characteristics on the Variation of Thickness and Deposition Rate in Organic Layer of OLEDs  

Lee, Young-Hwan (광운대학교 전기공학과)
Kim, Weon-Jong (광운대학교 전기공학과)
Yang, Jae-Hoon (광운대학교 전기공학과)
Shin, Jong-Yeol (삼육대학교 자동차과)
Kim, Tae-Wan (홍익대학교 물리학과)
Hong, Jin-Woong (광운대학교 전기공학과)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.19, no.4, 2006 , pp. 362-366 More about this Journal
Abstract
OLEDs(Organic Light Emitting Diodes) are attractive as alternative display components because of their relative merits of being self-emitting, having large intrinsic viewing angle and fast switching speed. But because of their relatively short history of development, much remains to be studied in terms of their basic device physics and design, manufacturing techniques, stability and so on. We investigated electrical properties of N, N-diphenyl-N, N bis (3-methyphenyl-l,1'-biphenyl-4,4'-diamine (TPD) and tris-8-hydroxyquinoline aluminum$(Alq_3)$ when their thicknesses were changed variedly from 3:7 to 5:5 of their thickness ratios. And we also studied properties of OLED depend on their deposition rate between $0.05{\sim}0.2$ nm/s.
Keywords
OLED; Hole transport layer; Emission layer; Deposition rate; Luminance;
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