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http://dx.doi.org/10.4313/JKEM.2005.18.10.909

Electrical Characteristics of ZnO Piezo-electric Thin film for SAW filter  

Lee, Dong-Yoon (중부대학교 정보통신학과)
Yoon, Seok-Jin (한국과학기술연구원 박막재료연구센터)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.18, no.10, 2005 , pp. 909-916 More about this Journal
Abstract
The structural and electrical property of RF magnetron sputtered ZnO thin film have been studied as a function of RF power, substrate temperature, oxygen/argon gas ratio and film thickness at constant sputtering power, sputtering working pressure and target-substrate distance. To analyze a crystallo-graphic properties of the films, $\theta$/2$\theta$ mode X-ray diffraction, SEM, and AFM analyses. C-axis preferred orientation, resistivity and surface roughness highly depended on oxygen/argon gas ratio. The resistivity of ZnO thin film(6000 ${\AA}$) rapidly increased with increasing oxygen ratio and the resistivity value of $9 {\ast} 10^7 {\Omega}cm$ was obtained at a working pressure of 10 mTorr with the same oxygen/argon gas ratio. The surface roughness was also improved with increasing oxygen ratio and the ZnO films deposited with the same oxygen/argon gas ratio showed the excellent roughness value of 28.7 ${\AA}$. With increase of the substrate temperature, The C-axis preferred orientation of ZnO thin film increases and the resistivity decreases due to deviation from the stoichiometric ZnO due to oxygen deficiency.
Keywords
ZnO; Preferred orientation; Roughness; Resistivity; Stoichiometric;
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