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http://dx.doi.org/10.4313/JKEM.2004.17.8.904

Dielectric Properties of XLPE/Semiconductor Sheet in Power Cables  

이관우 (원광대학교 재료공학과)
이경용 (원광대학교 재료공학)
최용성 (원광대학교 재료공학)
박대희 (원광대학교 재료공학과)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.17, no.8, 2004 , pp. 904-909 More about this Journal
Abstract
We studied the dielectric properties and voltage dependence on slice XLPE sheet from 22 kV and 154 kV power cables. Interface structures are XLPE/semiconductor and XLPE/water/semiconductor capacitance and tan6 of 22 kV, 154 kV were 52/42 pF and $7.4\times{10}/^{-4}, 2.15\times{10}^{-4}$, respectively in these results, the trend was increased with the increase of temperature the tan$\delta$ of XLPE/semiconductive layer and XLPE/water/ semiconductive layer were increased as compared with that of XLPE Temperature reliability of tan$\delta$ was small.
Keywords
XLPE sheet; Semiconductor sheet; Dielectric properties; Capacitance; Tan$\delta$;
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