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http://dx.doi.org/10.4313/JKEM.2004.17.4.439

Study for Thermal Stability of Liquid Crystal Device  

이상극 (광운대학교 전기공학과)
황정연 (연세대학교 전기전자공학과)
서대식 (연세대학교 전기전자공학과)
이준웅 (광운대학교 전기공학과)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.17, no.4, 2004 , pp. 439-442 More about this Journal
Abstract
In this study, we investigated about electrooptics characteristic of three kinds of TN cell on the polyimide surface. Monodomain alignments of thermal stressed TN cell over temperature of liquid crystal isotropic phase were almost the same as that of no thermal stressed TN cells. However, the thermal stressed TN cells have many defects. Also, threshold voltage and response time of thermal stressed TN cells show the same performances as no thermal stressed TN cells. There were little changes of value in these TN cells. However, transmittances of TN cells on the polyimide surface decrease with increasing thermal stress time. Finally, the residual DC voltage of the thermal stressed TN cell on the polyimide surface shows decrease of characteristics as increasing thermal stress time. Therefore, the thermal stability of TN cell was decreased by high thermal stress for the long times.
Keywords
Liquid crystal; Thermal stress; Electrooptics characteristic; Residual DC voltage;
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Times Cited By KSCI : 3  (Citation Analysis)
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