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http://dx.doi.org/10.4313/JKEM.2003.16.2.108

Microwave Dielectric constant characteristics or (Al,Mg,Ta)O2 Solid Solutions with Crystal Structure and Ionic Polarizability  

최지원 (한국과학기술연구원 박막기술연구센터)
하종윤 (한국과학기술연구원 박막기술연구센터)
안병국 (전북대학교 신소재공학부)
박용욱 (박용욱)
윤석진 (한국과학기술연구원 박막기술연구센터)
김현재 (한국과학기술연구원 박막기술연구센터)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.16, no.2, 2003 , pp. 108-112 More about this Journal
Abstract
The calculated and measured dielectric constants of (1-x)(A $l_{1}$2/ T $a_{1}$2/) $O_2$-x(M $g_{1}$3/ T $a_{2}$3/) $O_2$ (0$\leq$x$\leq$1.0) solid solutions were investigated by variations of ionic polarizability and crystal structure. (A $l_{1}$2/ T $a_{1}$2/) $O_2$ and (M $g_{1}$3/ T $a_{2}$3/) $O_2$ were orthorhombic and tetragonal trirutile structure, respectively. When (A $l_{1}$2/ T $a_{1}$2/) $O_2$ was substituted by (M $g_{1}$3/ T $a_{2}$3/) $O_2$, the phase transformed to tetragonal structure over 60 mole. Because the total ionic radius of [(Mg+2Ta)/3]$^{4+}$ was slightly bigger than one of [(Al+Ta)/2]$^{4+}$, the lattice parameters increased with an increase of (M $g_{1}$3/ T $a_{2}$3/) $O_2$ substitution. The measured dielectric constant increased with an increase of (M $g_{1}$3/ T $a_{2}$3/) $O_2$ substitution and coincided with dielectric mixing rule and the calculated dielectric constant with the molecular additivity rule. There were some differences between the measured and the calculated dielectric constant. The reason of the lowered dielectric constant comparing with the calculated one was compressed stress due to the electronic structure of tantalum.
Keywords
Dielectric constant; Orthorhombic; Tetragonal; Ionic polarizability; Additivity rule;
Citations & Related Records
Times Cited By KSCI : 6  (Citation Analysis)
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