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http://dx.doi.org/10.4313/JKEM.2002.15.11.997

Analysis of Sticking Coefficient in Bi-Superconducting Thin film  

천민우 (동신대학교 전기전자공학부)
박용필 (동신대학교 전기전자공학부)
이성일 (충주대학교)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.15, no.11, 2002 , pp. 997-1002 More about this Journal
Abstract
BSCCO thin films are fabricated by an ion beam sputtering method, and sticking coefficients of the respective elements are evaluated. The sticking coefficient of Bi element in BSCCO film formation was observed to show a unique temperature dependence; it was almost a constant value of 0.49 below about 730$^{\circ}C$ and decreased linearly over about 730$^{\circ}C$ In contrast, Sr and Ca, displayed no such remarkable temperature dependence. This behavior of the sticking coefficient was explained consistently on the basis of the evaporation and sublimation processes of Bi$\sub$2/O$\sub$3/. It was concluded that Bi(2212) thin film constructs from the partial melted Bi(2201) phase with the aid of the liquid phase of Bi$\sub$2/O$\sub$3/.
Keywords
Sticking coefficient; IBS System; BSCCO thin film; Bi 2201 phase; Bi 2212 phase;
Citations & Related Records
Times Cited By KSCI : 3  (Citation Analysis)
연도 인용수 순위
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