Browse > Article
http://dx.doi.org/10.4313/JKEM.2002.15.11.958

Fabrication of 3-Dimensional Microstructures for Bulk Micromachining by SDB and Electrochemical Etch-Stop  

정귀상 (동서대학교 정보시스템공학부)
김재민 (동서대학교 정보시스템공학부)
윤석진 (한국과학기술연구원 박막기술연구센터)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.15, no.11, 2002 , pp. 958-962 More about this Journal
Abstract
This paper reports on the fabrication of free-standing microstructures by DRIE (deep reactive ion etching). SOI (Si-on-insulator) structures with buried cavities are fabricated by SDB (Si-wafer direct bonding) technology and electrochemical etch-stop. The cavity was formed the upper handling wafer by Si anisotropic etch technique. SDB process was performed to seal the formed cavity under vacuum condition at -760 mmHg. In the SDB process, captured air and moisture inside of the cavities were removed by making channels towards outside. After annealing (100$0^{\circ}C$, 60 min.), the SDB SOI structure with a accurate thickness and a good roughness was thinned by electrochemical etch-stop in TMAH solution. Finally, it was fabricated free-standing microstructures by DRIE. This result indicates that the fabrication technology of free-standing microstructures by combination SDB, electrochemical etch-stop and DRIE provides a powerful and versatile alternative process for high-performance bulk micromachining in MEMS fields.
Keywords
Free-standing microstructure; micromachining; SDB; SOI; Electrochemical etch-stop; DRIE;
Citations & Related Records
연도 인용수 순위
  • Reference
1 A pressure-balanced electro-statically actuated microvalve /
[ M. A. Huff;M. S. Mattner;T. A. Lober;M. A. Schmidt ] / IEEE Solid-State Sensors & Actuators Workshop
2 A monolithic silicon accelerometer with integral air damping and over-range protection /
[ P. Barth;F. Pourahmadi;R. Mayer;J. Poydock;K. Pertersen ] / IEEE Solid-State Sensors & Actuators Workshop
3 Fabrication of SOI wafers with buried cavities using silicon fusion bonding and electrochemical etchback /
[ J. M. Noworolski;E. Klaassen;J. Petersen;N. I. Maluf ] / Sensors & Actuators A   DOI   ScienceOn
4 Electrochemical etch-stop characteristics of TMAH/IPA/pyrazine solutions /
[ G. S. Chung;W. J. Lee;J. S. Song ] / Sensors & Materials
5 A study on electrochemical etch-stop in TMAH/IPA/pyrazine solutions /
[ G. S. Chung;J. S. Park ] / J. Korea Sensors Soc.(in Korean)
6 A study on pre-bonding according to HF pre-treatment conditions in Si wafer direct bonding /
[ G. S. Chung;K. D. Kang ] / J. Korea Sensors Soc.(in Korean)
7 A computer controlled polishing system for silicon-on-insulator /
[ A. Yamada;O. Okabayashi;T. Nakamura;E. Kanda;M. Kawashima ] / Proc. of the 5th Int. Workshop on Future Electron. Devices, Jpn.
8 MOSFET's on silicon prepared by moving melt zone recrystallization of encapsulated poly-crystalline silicon on an insulating substrate /
[ E. W. Maby;M. W. Geis;Y. L. Lecos;D. J. Siversmick;R. W. Mountain;D. A. Antoniadias ] / IEEE Electron Device Letter
9 Multiple SOI structure fabricated by high dose oxygen implantation and epitaxial growth /
[ Y. Irita;Y. Kunii;M. Yakahashi;K. Kajiyama ] / Jpn. J. Appl. Phys.   DOI
10 An investigation of the electrochemical etching of (100)silicon in CsOH and KOH /
[ V. M. Mcneil;S. S. Wang;K. Y. Ng;M. A. Schmidt ] / IEEE Solid-State Sensors & Actuators Workshop
11 Investigation of buried etch stop layer in silicon made by nitrogen implantation /
[ A. Soderarg ] / J. Electrochem. Soc.   DOI
12 Epitaxial <TEX>$Al_2O_3$</TEX> films on Si low-pressure chemical vapor deposition /
[ M. Ishida;I. Katakabe;T. Nakamura ] / Appl. Phys. Lett.   DOI
13 /
[ S. Cristoloveanu;S. S. Li ] / Electrical Characteristics of Silicon on insulator Materials and Device
14 Formation of interface bubbles in bonded silicon wafer : a thermodynamic model /
[ K. Mitani;U. M. Gosele ] / Appl. Phys. Lett.