Introduction to the standard reference data of electron energy loss spectra and their database: eel.geri.re.kr |
Jeong Eun Chae
(Test Analysis Research Center, Innovative Technology Research Division, Gumi Electronics & Information Technology Research Institute)
Ji-Soo Kim (Test Analysis Research Center, Innovative Technology Research Division, Gumi Electronics & Information Technology Research Institute) Sang-Yeol Nam (Test Analysis Research Center, Innovative Technology Research Division, Gumi Electronics & Information Technology Research Institute) Min Su Kim (Test Analysis Research Center, Innovative Technology Research Division, Gumi Electronics & Information Technology Research Institute) Jucheol Park (Test Analysis Research Center, Innovative Technology Research Division, Gumi Electronics & Information Technology Research Institute) |
1 | R.F. Egerton, Electron energy-loss spectroscopy in the TEM. Rep. Prog. Phys. 72, 016502 (2009) |
2 | O.L. Krivanek, N. Dellby, J.A. Hachtel, J.C. Idrobo, M.T. Hotz, B. Plotkin-Swing, N.J. Bacon, A.L. Bleloch, G.J. Corbin, M.V. Hoffman, C.E. Meyer, T.C. Lovejoy, Progress in ultrahigh energy resolution EELS. Ultramicroscopy 203, 60-67 (2019) |
3 | L. Lajaunie, F. Boucher, R. Dessapt, P. Moreau, Quantitative use electron energyloss spectroscopy Mo-M2,3 edges for the study of molybdenum oxides. Ultramicroscopy 149, 1-8 (2015) |
4 | P. Ewels, T. Sikora, V. Serin, C.P. Ewels, L. Lajaunie, A complete overhaul of the EELS and XAS database: Eelsdb.Eu. Microsc. Microanal. 22, 717-724 (2016) |
5 | T. Riedl, T. Gemming, K. Wetzig, Extraction of EELS white-line intensities of manganese compounds: Methods, accuracy, and valence sensitivity. Ultramicroscopy 106, 284-291 (2006) |
6 | G. Zhu, S. Lazar, A.P. Knights, G.A. Botton, Atomic-level 2-dimensional chemical mapping and imaging of individual dopants in a phosphor crystal. Phys. Chem. Chem. Phys. 15, 11420-11426 (2013) |
7 | H. Tan, J. Verbeeck, A. Abakumov, G.V. Tendeloo, Oxidation state and chemical shift investigation in transition metal oxides by EELS. Ultramicroscopy 116, 24-33 (2012) |
8 | J. Verbeeck, S.V. Aart, Model based quantification of EELS spectra. Ultramicroscopy 101, 207-224 (2004) |
![]() |