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http://dx.doi.org/10.9729/AM.2016.46.3.117

A Brief Overview of Atom Probe Tomography Research  

Gault, Baptiste (Department of Microstructure Physics and Alloy Design, Max-Planck-Institut fur Eisenforschung GmbH)
Publication Information
Applied Microscopy / v.46, no.3, 2016 , pp. 117-126 More about this Journal
Abstract
Atom probe tomography (APT) has been fast rising in prominence over the past decade as a key tool for nanoscale analytical characterization of a range of materials systems. APT provides three-dimensional mapping of the atom distribution in a small volume of solid material. The technique has evolved, with the incorporation of laser pulsing capabilities, and, combined with progress in specimen preparation, APT is now able to analyse a very range of materials, beyond metals and alloys that used to be its core applications. The present article aims to provide an overview of the technique, providing a brief historical perspective, discussing recent progress leading to the state-of-the-art, some perspectives on its evolution, with targeted examples of applications.
Keywords
Atom probe tomography; Field evaporation; Materials characterization; Microscopy; Nanoscale;
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1 Suram S K and Rajan K (2013) Calibration of reconstruction parameters in atom probe tomography using a single crystallographic orientation. Ultramicroscopy 132, 136-142.   DOI
2 Thompson K, Lawrence D, Larson D J, Olson J D, Kelly T F, and Gorman B (2007) In situ site-specific specimen preparation for atom probe tomography. Ultramicroscopy 107, 131-139.   DOI
3 Tsong T T and Kinkus T J (1984) Energy distributions of pulsed-laser fielddesorbed gaseous ions and field-evaporated metal ions: a direct time-of-flight measurement. Phys. Rev. B 29, 529.
4 Tsong T T, McLane S B, and Kinkus T J (1982) Pulsed-laser time-of-flight atom-probe field ion microscope. Rev. Sci. Instrum. 53, 1442-1448.   DOI
5 Gault B, Vella A, Vurpillot F, Menand A, Blavette D, and Deconihout B (2007) Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitter. Ultramicroscopy 107, 713-719.   DOI
6 Vella A, Vurpillot F, Gault B, Menand A, and Deconihout B (2006) Evidence of field evaporation assisted by nonlinear optical rectification induced by ultrafast laser. Phys. Rev. B 73, 165416.   DOI
7 Shariq A, Al-Kassab T, Kirchheim R, Safarik D J, and Schwarz R B (2006) Exploring the next neighbourhood relationship in metallic glasses utilizing the atom probe tomography. In: 2006 19th International Vacuum Nanoelectronics Conference, pp. 19-20, (IEEE).
8 Uman E, Colonna-Dashwood M, Colonna-Dashwood L, Perger M, Klatt C, Leighton S, Miller B, Butler K T, Melot B C, Speirs R W, and Hendon C H (2016) The effect of bean origin and temperature on grinding roasted coffee. Sci. Rep. 6, 24483.   DOI
9 Valley J W, Cavosie A J, Ushikubo T, Reinhard D A, Lawrence D F, Larson D J, Clifton P H, Kelly T F, Wilde S A, and Moser D E (2014) Hadean age for a post-magma-ocean zircon confirmed by atom-probe tomography. Nat. Geosci. 7, 219-223.   DOI
10 Vella A, Deconihout B, Marrucci L, and Santamato E (2007) Femtosecond field ion emission by surface optical rectification. Phys. Rev. Lett. 99, 046103.   DOI
11 Vurpillot F, Da Costa G, Menand A, and Blavette D (2001) Structural analyses in three-dimensional atom probe: a Fourier transform approach. J. Microsc. 203, 295-302.   DOI
12 Gilbert M, Vurpillot F, Vella A, Bernas H, and Deconihout B (2007) Some aspects of the silicon behaviour under femtosecond pulsed laser field evaporation. Ultramicroscopy 107, 767-772.   DOI
13 Gault B, Vurpillot F, Bostel A, Menand A, and Deconihout B (2005) Estimation of the tip field enhancement on a field emitter under laser illumination. Appl. Phys. Lett. 86, 094101.   DOI
14 Gault B, Vurpillot F, Vella A, Gilbert M, Menand A, Blavette D, and Deconihout B (2006) Design of a femtosecond laser assisted tomographic atom probe. Rev. Sci. Instrum. 77, 043705.   DOI
15 Geiser B P, Kelly T F, Larson D J, Schneir J, and Roberts J P (2007) Spatial distribution maps for atom probe tomography. Microsc. Microanal. 13, 437-447.   DOI
16 Gordon L M and Joester D (2011) Nanoscale chemical tomography of buried organic-inorganic interfaces in the chiton tooth. Nature 469, 194-197.   DOI
17 Haley D, Petersen T, Barton G, and Ringer S (2009) Influence of field evaporation on radial distribution functions in atom probe tomography. Philos. Mag. 89, 925-943.   DOI
18 Hellman O C, Vandenbroucke J A, Rusing J, Isheim D, and Seidman D N (2000) Analysis of three-dimensional atom-probe data by the proximity histogram. Microsc. Microanal. 6, 437-444.
19 Herbig M, Choi P, and Raabe D (2015) Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography. Ultramicroscopy 153, 32-39.   DOI
20 Hono K, Ohkubo T, Chen Y, Kodzuka M, Oh-Ishi K, Sepehri-Amin H, Li F, Kinno T, Tomiya S, and Kanitani Y (2011) Broadening the applications of the atom probe technique by ultraviolet femtosecond laser. Ultramicroscopy 111, 576-583.   DOI
21 Walls J M, Southworth H N, and Rushton G J (1974) The preparation of field electron/field-ion emitters by ion etching. Vacuum 24, 475-479.   DOI
22 Vurpillot F, De Geuser F, Da Costa G, and Blavette D (2004) Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probe. J. Microsc. 216, 234-240.   DOI
23 Vurpillot F, Gault B, Geiser B P, and Larson D J (2013) Reconstructing atom probe data: a review. Ultramicroscopy 132, 19-30.   DOI
24 Vurpillot F, Houard J, Vella A, and Deconihout B (2009) Thermal response of a field emitter subjected to ultra-fast laser illumination. J. Phys. D-Applied Phys. 42, 125502.   DOI
25 Waugh A R, Payne S, Worrall G M, and Smith G D W (1984) In situ ion milling of field ion specimens using a liquid metal ion source. J. Phys. Colloq. 45, C9-207-C9-209.
26 Karlsson J, Sundell G, Thuvander M, and Andersson M (2014) Atomically resolved tissue integration. Nano Lett. 14, 4220-4223.   DOI
27 Wilde J, Cerezo A, and Smith G D W (2000) Three-dimensional atomicscale mapping of a cottrell atmosphere around a dislocation in iron. Scripta Mater. 43, 39-48.   DOI
28 Yao L, Moody M P, Cairney J M, Haley D, Ceguerra A V, Zhu C, and Ringer S P (2011) Crystallographic structural analysis in atom probe microscopy via 3D Hough transformation. Ultramicroscopy 111, 458-463.   DOI
29 Jagutzki O, Cerezo A, Czasch A, Dorner R, Hattas M, Huang M, Mergel V, Spillmann U, Ullmann-Pfleger K, and Weber T (2002) Multiple hit readout of a microchannel plate detector with a three-layer delay-line anode. IEEE Trans. Nucl. Sci. 49, 2477-2483.   DOI
30 Karahka M, Xia Y, and Kreuzer H J (2015) The mystery of missing species in atom probe tomography of composite materials. Appl. Phys. Lett. 107, 062105.   DOI
31 Kellogg G L (1981) Determining the field emitter temperature during laser irradiation in the pulsed laser atom probe. J. Appl. Phys. 52, 5320-5328.   DOI
32 Kellogg G L (1982) Measurement of the charge state distribution of field evaporated ions: evidence for post-ionization. Surf. Sci. 120, 319-333.   DOI
33 Kellogg G L and Tsong T T (1980) Pulsed-laser atom-probe field-ion microscopy. J. Appl. Phys. 51, 1184-1193.   DOI
34 Kelly T F, Gribb T T, Olson J D, Martens R L, Shepard J D, Wiener S A, Kunicki T C, Ulfig R M, Lenz D R, and Strennen E M (2004) First data from a commercial local electrode atom probe (LEAP). Microsc. Microanal. 10, 373-383.   DOI
35 Kelly T F, Larson D J, Thompson K, Alvis R L, Bunton J H, Olson J D, and Gorman B P (2007) Atom probe tomography of electronic materials. Annu. Rev. Mater. Res. 37, 681-727.   DOI
36 Kelly T F, Vella A, Bunton J H, Houard J, Silaeva E P, Bogdanowicz J, and Vandervorst W (2014) Laser pulsing of field evaporation in atom probe tomography. Curr. Opin. Solid State Mater. Sci. 18, 81-89.   DOI
37 Kelly T F, Voelkl E, and Geiser B P (2009) Practical determination of spatial resolution in atom probe tomography. Microsc. Microanal. 15, 12.   DOI
38 Krug M E, Mao Z, Seidman D N, and Dunand D C (2014) Comparison between dislocation dynamics model predictions and experiments in precipitation-strengthened Al-Li-Sc alloys. Acta Mater. 79, 382-395.   DOI
39 Kim J H, Kim B K, Kim D I, Choi P P, Raabe D, and Yi K W (2015) The role of grain boundaries in the initial oxidation behavior of austenitic stainless steel containing alloyed Cu at $700^{\circ}C$ for advanced thermal power plant applications. Corros. Sci. 96, 52-66.   DOI
40 Kingham D R (1982) The post-ionization of field evaporated ions: a theoretical explanation of multiple charge states. Surf. Sci. 116, 273-301.   DOI
41 Kuzmina M, Herbig M, Ponge D, Sandlöbes S, and Raabe D (2015) Linear complexions: confined chemical and structural states at dislocations. Science 349, 1080-1083.   DOI
42 La Fontaine A, Yen H-W, Felfer P J, Ringer S P, and Cairney J M (2015) Atom probe study of chromium oxide spinels formed during intergranular corrosion. Scripta Mater. 99, 1-4.   DOI
43 La Fontaine A, Zavgorodniy A, Liu H, Zheng R, Swain M, and Cairney J (2016) Atomic-scale compositional mapping reveals Mg-rich amorphous calcium phosphate in human dental enamel. Sci. Adv. 2, e1601145.   DOI
44 Larson D J, Foord D T, Petford-Long A K, Anthony T C, Rozdilsky I M, Cerezo A, and Smith G W D (1998) Focused ion-beam milling for field-ion specimen preparation:: preliminary investigations. Ultramicroscopy 75, 147-159.   DOI
45 Larson D J, Lawrence D, Lefebvre W, Olson D, Prosa T J, Reinhard D A, Ulfig R M, Clifton P H, Bunton J H, and Lenz D (2011a) Toward atom probe tomography of microelectronic devices. J. Phys.: Conf. Ser. Vol. 326, 012030.   DOI
46 Mao Z G, Sudbrack C K, Yoon K E, Martin G, and Seidman D N (2007) The mechanism of morphogenesis in a phase-separating concentrated multicomponent alloy. Nat. Mater. 6, 210-216.   DOI
47 Larson D J, Lawrence D, Olson D, Prosa T J, Ulfig R M, Reinhard D A, Clifton P H, Kelly T F, and Lefebvre W (2011b) From the store shelf to device-level atom probe analysis: an exercise in feasibility. In: 37th International Symposium for Testing and Failure Analysis, pp. 189- 197, (ISTFA 2011, San Jose).
48 Larson D J, Cerezo A, Juraszek J, Hono K, and Schmitz G (2009) Atomprobe tomographic studies of thin films and multilayers. MRS Bull. 34, 732-737.   DOI
49 Larson D J, Gault B, Geiser B P, De Geuser F, and Vurpillot F (2013) Atom probe tomography spatial reconstruction: status and directions. Curr. Opin. Solid State Mater. Sci. 17, 236-247.   DOI
50 Araullo-Peters V J, Breen A, Ceguerra A V, Gault B, Ringer S P, and Cairney J M (2015) A new systematic framework for crystallographic analysis of atom probe data. Ultramicroscopy 154, 7-14.   DOI
51 Bas P, Bostel A, Deconihout B, and Blavette D (1995) A general protocol for the reconstruction of 3D atom probe data. Appl. Surf. Sci. 87, 298-304.
52 Beavan L A, Scanlan R M, and Seidman D N (1971) The defect structure of depleted zones in irradiated tungsten. Acta Metall. 19, 1339-1350.   DOI
53 Marquis E A, Bachhav M, Chen Y, Dong Y, Gordon L M, and McFarland A (2013) On the current role of atom probe tomography in materials characterization and materials science. Curr. Opin. Solid State Mater. Sci. 17, 217-223.   DOI
54 Marceau R K W, Stephenson L T, Hutchinson C R, and Ringer S P (2011) Quantitative atom probe analysis of nanostructure containing clusters and precipitates with multiple length scales. Ultramicroscopy 111, 738-742.   DOI
55 Marceau R K W, Gutierrez-Urrutia I, Herbig M, Moore K L, Lozano-Perez S, and Raabe D (2013) Multi-scale correlative microscopy investigation of both structure and chemistry of deformation twin bundles in Fe-Mn-C steel. Microsc. Microanal. 19, 1581-1585.   DOI
56 Marquis E A (2002) Microstructural evolution and strengthening mechanisms in Al-Sc and Al-Mg-Sc alloys, Ph.D dissertation, (Northwestern University, Evanston).
57 Marquis E A and Hyde J M (2010) Applications of atom-probe tomography to the characterisation of solute behaviours. Mater. Sci. Eng. R Reports 69, 37-62.   DOI
58 Blum I, Rigutti L, Vurpillot F, Vella A, Gaillard A, and Deconihout B (2016) Dissociation dynamics of molecular ions in high DC electric field. J. Phys. Chem. A 120, 3654-3662.   DOI
59 Bemont E, Bostel A, Bouet M, Da Costa G, Chambreland S, Deconihout B, and Hono K (2003) Effects of incidence angles of ions on the mass resolution of an energy compensated 3D atom probe. Ultramicroscopy 95, 231-238.   DOI
60 Blavette D, Bostel A, Sarrau J M, Deconihout B, and Menand A (1993) An atom probe for three-dimensional tomography. Nature 363, 432-435.   DOI
61 Boll T, Al-Kassab T, Yuan Y, and Liu Z G (2007) Investigation of the site occupation of atoms in pure and doped $TiAl/Ti_3Al$ intermetallic. Ultramicroscopy 107, 796-801.   DOI
62 Breen A J, Moody M P, Ceguerra A V, Gault B, Araullo-Peters V J, and Ringer S P (2015) Restoring the lattice of Si-based atom probe reconstructions for enhanced information on dopant positioning. Ultramicroscopy 159, 314-323.   DOI
63 Breen A J, Xie K Y, Moody M P, Gault B, Yen H W, Wong C C, Cairney J M, and Ringer S P (2014) Resolving the morphology of niobium carbonitride nano-precipitates in steel using atom probe tomography. Microsc. Microanal. 20, 1100-1110.
64 Brenner S S and Goodman S R (1971) FIM-atom probe analysis of thin nitride platelets in Fe-3 at.% Mo. Scripta Metall. 5, 865-869.   DOI
65 Meisnar M, Moody M, and Lozano-Perez S (2015) Atom probe tomography of stress corrosion crack tips in SUS316 stainless steels. Corros. Sci. 98, 661-671.   DOI
66 Bunton J, Lenz D, Olson J, Thompson K, Ulfig R, Larson D, and Kelly T (2006) Instrumentation developments in atom probe tomography: applications in semiconductor research. Microsc. Microanal. 12, 1730-1731.   DOI
67 Bunton J H, Olson J D, Lenz D R, and Kelly T F (2007) Advances in pulsedlaser atom probe: instrument and specimen design for optimum performance. Microsc. Microanal. 13, 418-427.   DOI
68 Marquis E A, Hyde J M, Saxey D W, Lozano-Perez S, de Castro V, Hudson D, Williams C A, Humphry-Baker S, and Smith G D (2009a) Nuclear reactor materials at the atomic scale. Mater. Today 12, 30-37.
69 Marquis E A, Miller M K, Blavette D, Ringer S P, Sudbrack C K, and Smith G D (2009b) Structural materials: understanding atomic-scale microstructures. MRS Bull. 34, 725-731.   DOI
70 Mazumder B, Vella A, and Déconihout B (2011) Evaporation mechanisms of MgO in laser assisted atom probe tomography. Ultramicroscopy 111, 571-575.   DOI
71 Cerezo A, Godfrey T J, Sijbrandij S J, Smith G D W, and Warren P J (1998) Performance of an energy-compensated three-dimensional atom probe. Rev. Sci. Instrum. 69, 49-58.   DOI
72 Cadel E, Vurpillot F, Larde R, Duguay S, and Deconihout B (2009) Depth resolution function of the laser assisted tomographic atom probe in the investigation of semiconductors. J. Appl. Phys. 106, 044908.   DOI
73 Cerezo A, Clifton P H, Gomberg A, and Smith G D W (2007a) Aspects of the performance of a femtosecond laser-pulsed 3-dimensional atom probe. Ultramicroscopy 107, 720-725.   DOI
74 Cerezo A, Clifton P H, Galtrey M J, Humphreys C J, Kelly T F, Larson D J, Lozano-Perez S, Marquis E A, Oliver R A, and Sha G (2007b) Atom probe tomography today. Mater. Today 10, 36-42.
75 Cerezo A, Godfrey T J, and Smith G D W (1988) Application of a positionsensitive detector to atom probe microanalysis. Rev. Sci. Instrum. 59, 862-866.   DOI
76 Chen Y M, Ohkubo T, and Hono K (2011) Laser assisted field evaporation of oxides in atom probe analysis. Ultramicroscopy 111, 562-566.   DOI
77 Clifton P H, Gribb T T, Gerstl S S A, Ulfig R M, and Larson D J (2008) Performance advantages of a modern, ultra-high mass resolution atom probe. Microsc. Microanal. 14, 454-455.   DOI
78 Da Costa G, Vurpillot F, Bostel A, Bouet M, and Deconihout B (2005) Design of a delay-line position-sensitive detector with improved performance. Rev. Sci. Instrum. 76, 013304.   DOI
79 Melmed A J (1991) The art and science and other aspects of making sharp tips. J. Vac. Sci. 9, 601-608.   DOI
80 Melmed A J, Sakurai T, Kuk Y, and Givargizov E I (1981) Feasibility of ToF atom-probe analysis of silicon. Surf. Sci. 103, L139-L142.
81 Miller M K (2000) The development of atom probe field-ion microscopy. Mater. Charact. 44, 11-27.   DOI
82 Miller M K and Russell K F (2006) Atom probe specimen preparation with a dual beam FIB Miller. In: 2006 19th International Vacuum Nanoelectronics Conference, pp. 147-148, (IEEE).
83 Moody M P, Ceguerra A V, Breen A J, Cui X Y, Gault B, Stephenson L T, Marceau R K, Powles R C, and Ringer S P (2014) Atomically resolved tomography to directly inform simulations for structure-property relationships. Nat. Commun. 5.
84 Moody M P, Gault B, Stephenson L T, Haley D, and Ringer S P (2009) Qualification of the tomographic reconstruction in atom probe by advanced spatial distribution map techniques. Ultramicroscopy 109, 815-824.   DOI
85 Faulkner R G and Ralph B (1972) Field-ion microscopy of the early stages of γ'precipitation in a nickel-aluminium alloy. Acta Metall. 20, 703-710.   DOI
86 Dagan M, Hanna L R, Xu A, Roberts S G, Smith G D W, Gault B, Edmondson P D, Bagot P A, and Moody M P (2015) Imaging of radiation damage using complementary field ion microscopy and atom probe tomography. Ultramicroscopy 159, 387-394.   DOI
87 De Geuser F, Dorin T, Lefebvre W, Gault B, and Deschamps A (2014) Complementarity of atom probe, small angle scattering and differential scanning calorimetry for the study of precipitation in aluminium alloys. In: Materials Science Forum, Vol. 794, eds Marthinsen K, Holmedal B, and Li Y, pp. 926-932, (Trans Tech Publications, Pfaffikon).
88 De Geuser F, Lefebvre W, and Blavette D (2006) 3D atom probe study of solute atoms clustering during natural ageing and pre-ageing of an Al-Mg-Si alloy. Philos. Mag. Lett. 86, 227-234.
89 Deconihout B, Vurpillot F, Gault B, Da Costa G, Bouet M, Bostel A, Blavette D, Hideur A, Martel G, and Brunel M (2007) Toward a laser assisted wide-angle tomographic atom-probe. Surf. Interface Anal. 39, 278-282.   DOI
90 Dempsey N M, Woodcock T G, Sepehri-Amin H, Zhang Y, Kennedy H, Givord D, Hono K, and Gutfleisch O (2013) High-coercivity Nd-Fe-B thick films without heavy rare earth additions. Acta Mater. 61, 4920-4927.   DOI
91 Felfer P J, Alam T, Ringer S P, and Cairney J M (2012) A reproducible method for damage-free site-specific preparation of atom probe tips from interfaces. Microsc. Res. Tech. 75, 484-491.   DOI
92 Forbes R G (1995) Field evaporation theory: a review of basic ideas. Appl. Surf. Sci. 87, 1-11.
93 Gault B, Chen Y, Moody M, Ohkubo T, Hono K, and Ringer S (2011a) Influence of the wavelength on the spatial resolution of pulsed-laser atom probe. J. Appl. Phys. 110, 094901.   DOI
94 Müller E W (1956) Resolution of the atomic structure of a metal surface by the field ion microscope. J. Appl. Phys. 27, 474-476.   DOI
95 Moody M P, Gault B, Stephenson L T, Marceau R K, Powles R C, Ceguerra A V, Breen A J, and Ringer S P (2011) Lattice rectification in atom probe tomography: toward true three-dimensional atomic microscopy. Microsc. Microanal. 17, 226-239.
96 Moody M P, Stephenson L T, Ceguerra A V, and Ringer S P (2008) Quantitative binomial distribution analyses of nanoscale like-solute atom clustering and segregation in atom probe tomography data. Microsc. Res. Tech. 71, 542-550.   DOI
97 Moody M P, Stephenson L T, Liddicoat P V, and Ringer S P (2007) Contingency table techniques for three dimensional atom probe tomography. Microsc. Res. Tech. 70, 258-268.   DOI
98 Muller E W and Bahadur K (1956) Field ionization of gases at a metal surface and the resolution of the field ion microscope. Phys. Rev. 102, 624.   DOI
99 Muller E W, Panitz J A, and McLane S B (1968) The atom-probe field ion microscope. Rev. Sci. Instrum. 39, 83-86.   DOI
100 Müller M, Gault B, Smith G D W, and Grovenor C R M (2011a) Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis. J. Phys.: Conf. Ser. 326, 012031.   DOI
101 Müller M, Saxey D W, Smith G D W, and Gault B (2011b) Some aspects of the field evaporation behaviour of GaSb. Ultramicroscopy 111, 487-492.   DOI
102 Nakamura S and Kuroda T (1978) Atom-probe fim studies of $\beta$-SiC whiskers. Surf. Sci. 70, 452-458.   DOI
103 Nishikawa O, Ohtani Y, Maeda K, Watanabe M, and Tanaka K (2000) Development of the scanning atom probe and atomic level analysis. Mater. Charact. 44, 29-57.   DOI
104 Stoian R, Ashkenasi D, Rosenfeld A, and Campbell E E B (2000) Coulomb explosion in ultrashort pulsed laser ablation of $Al_2O_3$. Phys. Rev. B 62, 13167.   DOI
105 Gault B, Cui X Y, Moody M P, De Geuser F, Sigli C, Ringer S P, and Deschamps A (2012) Atom probe microscopy investigation of Mg site occupancy within ${\delta} precipitates in an Al-Mg-Li alloy. Scripta Mater. 66, 903-906.   DOI
106 Panayi P (2006) A reflectron for use in a three-dimensional atom probe. Gt. Britain Pat. # GB2426120A.
107 Silaeva E P, Arnoldi L, Karahka M L, Deconihout B, Menand A, Kreuzer H J, and Vella A (2014) Do dielectric nanostructures turn metallic in highelectric dc fields? Nano Lett. 14, 6066-6072.   DOI
108 Silaeva E P, Karahka M, and Kreuzer H J (2013) Atom probe tomography and field evaporation of insulators and semiconductors: theoretical issues. Curr. Opin. Solid State Mater. Sci. 17, 211-216.   DOI
109 Stephenson L T, Moody M P, Gault B, and Ringer S P (2013) Nearest neighbour diagnostic statistics on the accuracy of APT solute cluster characterisation. Philos. Mag. 93, 975-989.   DOI
110 Stephenson L T, Moody M P, Liddicoat P V, and Ringer S P (2007) New techniques for the analysis of fine-scaled clustering phenomena within atom probe tomography (APT) data. Microsc. Microanal. 13, 448-463.   DOI
111 Gault B, Moody M P, De Geuser F, La Fontaine A, Stephenson L T, Haley D, and Ringer S P (2010b) Spatial resolution in atom probe tomography. Microsc. Microanal. 16, 99-110.   DOI
112 Gault B, Haley D, De Geuser F, Moody M, Marquis E, Larson D, and Geiser B (2011b) Advances in the reconstruction of atom probe tomography data. Ultramicroscopy 111, 448-457.   DOI
113 Gault B, La Fontaine A, Moody M P, Ringer S P, and Marquis E A (2010a) Impact of laser pulsing on the reconstruction in an atom probe tomography. Ultramicroscopy 110, 1215-1222.   DOI
114 Gault B, Moody M P, De Geuser F, Haley D, Stephenson L T, and Ringer S P (2009a) Origin of the spatial resolution in atom probe microscopy. Appl. Phys. Lett. 95, 034103.   DOI
115 Gault B, Moody M P, de Geuser F, Tsafnat G, La Fontaine A, Stephenson L T, Haley D, and Ringer S P (2009b) Advances in the calibration of atom probe tomographic reconstruction. J. Appl. Phys. 105, 034913.   DOI
116 Gault B, Müller M, La Fontaine A, Moody M, Shariq A, Cerezo A, Ringer S, and Smith G (2010c) Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography. J. Appl. Phys. 108, 044904.   DOI
117 Gault B, Saxey D W, Ashton M W, Sinnott S B, Chiaramonti A N, Moody M P, and Schreiber D K (2016) Behavior of molecules and molecular ions near a field emitterThis work is a partial contribution of the US Government and therefore is not subject to copyright in the United States. New J. Phys. 18, 033031.   DOI
118 Gault B, Scenini F, Moody M P, Huang J H, Botton G A, Mangelinck D, Descoins M, and Newman R C (2013) Atom Probe Characterization of Corroded Alloy 600. Microsc. Microanal. 19, 1020-1021.   DOI
119 Rigutti L, Vella A, Vurpillot F, Gaillard A, Sevelin-Radiguet N, Houard J, Hideur A, Martel G, Jacopin G, and Bugallo A D L (2013) Coupling atom probe tomography and photoluminescence spectroscopy: exploratory results and perspectives. Ultramicroscopy 132, 75-80.   DOI
120 Peterman E M, Reddy S M, Saxey D W, Snoeyenbos D R, Rickard W D, Fougerouse D, and Kylander-Clark A R (2016) Nanogeochronology of discordant zircon measured by atom probe microscopy of Pbenriched dislocation loops. Sci. Adv. 2, e1601318.   DOI
121 Rolland N, Larson D J, Geiser B P, Duguay S, Vurpillot F, and Blavette D (2015) An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials. Ultramicroscopy 159, 195-201.   DOI
122 Schreiber D K, Olszta M J, Saxey D W, Kruska K, Moore K, Lozano-Perez S, and Bruemmer S M (2013) Examinations of oxidation and sulfidation of grain boundaries in alloy 600 exposed to simulated pressurized water reactor primary water. Microsc. Microanal. 19, 676-687.
123 Sebastian J T, Hellman O C, and Seidman D N (2001) New method for the calibration of three-dimensional atom-probe mass spectra. Rev. Sci. Instrum. 72, 2984-2988.   DOI
124 Seidman D N (2007) Three-dimensional atom-probe tomography: advances and applications. Annu. Rev. Mater. Res. 37, 127-158.   DOI
125 Sha G, Yao L, Liao X, Ringer S P, Duan Z C, and Langdon T G (2011) Segregation of solute elements at grain boundaries in an ultrafine grained Al-Zn-Mg-Cu alloy. Ultramicroscopy 111, 500-505.   DOI