1 |
Allen J E, Hemesath E R, Perea D E, Lensch-Falk J L, Li Z Y, Yin F, Gass M H, Wang P, Bleloch A L, Palmer R E, and Lauhon L J (2008) Highresolution detection of Au catalyst atoms in Si nanowires. Nat. Nanotechnology 3, 168-173.
DOI
|
2 |
Blumtritt H, Isheim D, Senz S, Seidman D N, and Moutannabbir O (2014) Preparation of nanowire specimens for laser-assisted atom probe tomography. Nanotechnology 25, 435704-1-7.
DOI
|
3 |
Bunton J H, Olson J D, Lenz D R, and Kelly T F (2007) Advances in pulsedlaser atom probe: instrument and specimen design for optimum performance. Mirosc. Microanal. 13, 418-427.
DOI
|
4 |
Eichfeld C M, Gerstl S S A, Prosa T, Ke Y, Redwing J M, and Mohney S E (2012) Local electrode atom probe analysis of silicon nanowires grown with an aluminum catalyst. Nanotechnology 23, 215205-1-6.
DOI
|
5 |
Felfer P, Li T, Eder K, Galinski H, Magyar A P, Bell D C, Smith G D W, Kruse N, Ringer S P, and Cairney J M (2015) New approaches to nanoparticle sample fabrication for atom probe tomography. Ultramicroscopy 159, 413-419.
DOI
|
6 |
Felfer P J, Alam T, Ringer S P, and Cairney J M (2012) A reproducible method for damage-free site-specifi c preparation of atom probe tips from interfaces. Micro. Res. Tech. 75, 484-491.
DOI
|
7 |
Gault B, Moody M P, Cairney J M, and Ringer S P (2012) Atom Probe Microscopy, p. 87, (Springer-Verlag New York, New York).
|
8 |
Kato N I (2004) Reducing focused ion beam damage to transmission electron microscopy samples. J. Elect. Micros. 53, 451-458.
DOI
|
9 |
Kelly T F, Bribb T T, Olson J D, Martens R L, and Shepard J D (2004) First data from a commercial local electrode atom probe (LEAP). Microsc. Microanal. 10, 378-383.
DOI
|
10 |
Kelly T F and Larson D J (2012) Atom probe tomography. Annu. Rev. Mater. Res. 42, 1-31.
DOI
|
11 |
Larson D J, Giddings A D, Wu Y, Verheijen M A, Prosa T J, Roozeboom F, Rice K P, Kessels W M M, Geiser B P, and Kelly T F (2015) Encapsulation method for atom probe tomography analysis of nanoparticles. Ultramicroscopy 159, 420-426.
DOI
|
12 |
Larson D J, Prosa Ty J, Ulfi g R M, Geiser B P, and Kelly T F (2013) Local Electrode Atom Probe Tomography (Springer-Verlag New York, New York). p. 30.
|
13 |
Lauhon L J (2009) Direct measurement of dopant distribution in an individual vapour-liquid-solid nanowire. Nat. Nanotechnol. 4, 315-319.
DOI
|
14 |
Perea D E, Allen J E, May S J, Wessels B W, Seidman D N, and Lauhon L J (2006) Three-dimensional nanoscale composition mapping of semiconductor nanowires. Nano Lett. 6, 181-185.
DOI
|
15 |
Thompson K, Lawrence D, Larson D J, Olson J D, Kelly T F, and Gorman B (2007) In situ site-specific specimen preparation for atom probe tomography. Ultramicroscopy 107, 131-139.
DOI
|