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http://dx.doi.org/10.9729/AM.2015.45.2.95

Temperature Calibration of a Specimen-heating Holder for Transmission Electron Microscopy  

Kim, Tae-Hoon (School of Advanced Materials Science & Engineering, Sungkyunkwan University)
Bae, Jee-Hwan (School of Advanced Materials Science & Engineering, Sungkyunkwan University)
Lee, Jae-Wook (School of Advanced Materials Science & Engineering, Sungkyunkwan University)
Shin, Keesam (School of Nano and Advanced Materials Engineering, Changwon National University)
Lee, Joon-Hwan (Advanced Materials & Device Lab., Corporate R&D Institute, Samsung Electro-Mechanics Co.)
Kim, Mi-Yang (Advanced Materials & Device Lab., Corporate R&D Institute, Samsung Electro-Mechanics Co.)
Yang, Cheol-Woong (School of Advanced Materials Science & Engineering, Sungkyunkwan University)
Publication Information
Applied Microscopy / v.45, no.2, 2015 , pp. 95-100 More about this Journal
Abstract
The in-situ heating transmission electron microscopy experiment allows us to observe the time- and temperature-dependent dynamic processes in nanoscale materials by examining the same specimen. The temperature, which is a major experimental parameter, must be measured accurately during in-situ heating experiments. Therefore, calibrating the thermocouple readout of the heating holder prior to the experiment is essential. The calibration can be performed using reference materials whose phase-transformation (melting, oxidation, reduction, etc.) temperatures are well-established. In this study, the calibration experiment was performed with four reference materials, i.e., pure Sn, Al-95 wt%Zn eutectic alloy, NiO/carbon nanotube composite, and pure Al, and the calibration curve and formula were obtained. The thermocouple readout of the holder used in this study provided a reliable temperature value with a relative error of <4%.
Keywords
Melting point; Dynamic observation; Annealing; Thermocouple; In-situ transmission electron microscopy;
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