Transmission Electron Microscopy Specimen Preparation for Layer-area Graphene by a Direct Transfer Method |
Cho, Youngji
(Department of Measurement & Analysis, National NanoFab Center)
Yang, Jun-Mo (Department of Measurement & Analysis, National NanoFab Center) Lam, Do Van (Nano Mechatronics, University of Science and Technology (UST)) Lee, Seung-Mo (Nano Mechatronics, University of Science and Technology (UST)) Kim, Jae-Hyun (Nano Mechatronics, University of Science and Technology (UST)) Han, Kwan-Young (OLED Module Team, Samsung Display Co., Ltd.) Chang, Jiho (Department of Applied Science, Korea Maritime and Ocean University) |
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