Quantitative Evaluation of Dislocation Density in Epitaxial GaAs Layer on Si Using Transmission Electron Microscopy |
Kim, Kangsik
(School of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST))
Lee, Jongyoung (School of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST)) Kim, Hyojin (Photonic-Bio Research Center, Korea Photonics Technology Institute (KOPTI)) Lee, Zonghoon (School of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST)) |
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