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Recum AFV, Shannon CE, Cannon CE, Long KJ, Kooten TGV, Meyle J: Surface roughness, porosity, and texture as modifiers of cellular adhesion. Tissue Eng 2 : 241-253, 1996.
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Scott CC, Luttge A, Athanasiou KA: Development and vlidation of vertical scanning interferometry as a novel method for acquiring chondrocyte geometry. J Biomed Mater Res 72A : 83-90, 2005.
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Sung YJ, Ryu JY, Song BK: Application of white light interferometry method for the measurement of surface micro-structure of paper products and prints. J Kor TAPPI 36 : 33-40, 2004.
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Kim KW, Cho DH, Kim PG: Morphology of foliar trichomes of the Chinese cork oak Quercus variabilis by electron microscopy and three-dimensional surface profiling. Microsc Microanal 17 : 461- 468, 2011a.
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Kim SW, Jin JH, Kang MG: Optical probe of white light interferometry for precision coordinate metrology. Proc Kor Soc Prec Eng 195-198, 2002.
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Kim KW, Kim DH, Han SS, Lee JC, Kim PG: Three-dimensional surface topography of the needle stomatal complexes of Pinus rigida and its hybrid species by complementary microscopy. Micron 41 : 571-576, 2010.
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Kim KW, Lee IJ, Kim CS, Lee DK, Park EW: Micromorphology of epicuticular waxes and epistomatal chambers of pine species by electron microscopy and white light scanning interferometry. Microsc Microanal 17 : 118-124, 2011b.
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Kim KW, Lee ST, Bae SW, Kim PG: 3D surface profiling and high resolution imaging for refining the Florin rings and epicuticular wax crystals of Pinus koraiensis. Microsc Res Techniq 74 : 1166- 1173, 2011c.
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Kim YS, Kim SW: Phase change on reflection in a white-light interferometer as polarization changes. Han Kwang H 15 : 331-336, 2004.
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Cross SE, Kreth J, Wali RP, Sullivan R, Shi W, Gimzewski JK: Evaluation of bacteria-induced enamel demineralization using optical profilometry. Dent Mater 25 : 1517-1526, 2009.
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Gorb E, Gorb S: Effects of surface topography and chemistry of Rumex obtusifolius leaves on the attachment of the beetle Gastrophysa viridula. Entomol Expt Appl 130 : 222-228, 2009.
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Kang MG, Kim SW: Depth profile measurement of laser engraved marks on silicon wafers by white light scanning interferometry. Proc Kor Soc Prec Eng 45-48, 1999.
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Kim GH, Jeon HJ, Yoon H: Electric field-aided formation combined with a nanoimprinting technique for replicating a plant leaf. Macromol Rapid Commun 30 : 991-996, 2009.
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Kim GH, Kim SW: Thin film thickness profile measurement using white light scanning interferometry. J Opt Soc Kor 10 : 373-378, 1999.
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