Nano Scale Compositional Analysis by Atom Probe Tomography: II. Applications on Electronic Devices and Nano Materials
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Jung, Woo-Young
(Department of Material Science and Engineering, POSTECH)
Bang, Chan-Woo (Department of Material Science and Engineering, POSTECH) Jang, Dong-Hyun (Department of Material Science and Engineering, POSTECH) Gu, Gil-Ho (Department of Material Science and Engineering, POSTECH) Park, Chan-Gyung (Department of Material Science and Engineering, POSTECH) |
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