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An Experimental Device for Understanding the Optical Principles of Image/Diffraction Formation  

Kim, Jin-Gyu (Division of Electron Microscopic Research, Korea Basic Science Institute)
Jeong, Jong-Man (Division of Electron Microscopic Research, Korea Basic Science Institute)
Kim, Mun-Chang (Division of Electron Microscopic Research, Korea Basic Science Institute)
Choi, Joo-Hyoung (Division of Electron Microscopic Research, Korea Basic Science Institute)
Kim, Youn-Joong (Division of Electron Microscopic Research, Korea Basic Science Institute)
Publication Information
Applied Microscopy / v.37, no.3, 2007 , pp. 199-208 More about this Journal
Abstract
We have made an optical device to study the wave optics phenomena, such as image and diffraction pattern, constructive and destructive interference, by direct operation of laser beam and optical lenses. It consists of laser beam, goniometer, objective lens, intermediate lens, projection lens, CCD system, and computing system. As a result of the performance test, we were able to magnify samples up to 44 times with the resolution of about $5{\mu}m$. It is expected to help EM users understanding more easily principles of transmission electron microscopy (TEM).
Keywords
Laser; Wave optics; Image; Diffraction; TEM;
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