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Fresnel Diffraction and Fraunhoffer Diffraction  

Lee, Hwack-Joo (New Materials Evaluation Center, Korea Research Institute of Standards and Science)
Publication Information
Applied Microscopy / v.32, no.2, 2002 , pp. 81-90 More about this Journal
Abstract
In this review, the author discussed how the Fresnel and Fraunhoffer Diffraction can be deduced from the Huygens-Fresnel principle and Kirchhoff Diffraction Theory. Fresnel diffraction became the basic theory of the CTEM image theory, and Fraunhoffer diffraction became the base for electron diffraction and HRTEM image theory by Fourier transformation. The author also discussed the diffraction based on Born series.
Keywords
Born series; Fraunhoffer diffraction; Fresnel diffraction; Huygens-Fresnel principle; Kirchhoff diffraction;
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