Application of Depth Resolution and Sensitivity Distribution of Electrical Resistivity Tomography to Modeling Weathered Zones and Land Creeping |
Kim, Jeong-In
(Department of Earth & Environmental Science, Chungbuk National University)
Kim, Ji-Soo (Department of Earth & Environmental Science, Chungbuk National University) Ahn, Young-Don (BOMIN Global Co., Ltd.) Kim, Won-Ki (Maritime Technology Research Institute, Agency for Defense Development) |
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