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M. J. Jeong and G. S. Jo, "Unpaired image Dehazing GAN With Global Dilation Block and Edge Loss," Autumn Annual Conference of IEIE, pp.1787-1790, 2020.
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D. Ngo, S. M. Lee and B. S. Kang, "Robust Single-Image Haze Removal Using Optimal Transmission Map and Adaptive Atmospheric Light," Remote Sens, 2020, vol.12, no.14, pp.2233, 2020. DOI: 10.3390/rs12142233
DOI
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J. H. Kim, "Low Complexity Single Image Dehazing via Edge-Preserving Transmission Estimation and Pixel-Based JBDC," Journal of the Korea Academia-Industrial cooperation Society, vol.20, no.12, pp.1-7, 2019. DOI: 10.5762/KAIS.2019.20.12.1
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D. Ngo, S. M. Lee, Q. H. Nguyen, T. M. Ngo, G. D. Lee and B. S. Kang, "Single Image Haze Removal from Image Enhancement Perspective for Real-Time Vision-Based Systems," Sensors 2020, vol.20, no.18, pp.5170, 2020. DOI: 10.3390/s20185170
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J. H. Park, D. K. Han and H. S. Ko, "Fusion of Heterogeneous Adversarial Networks for Single Image Dehazing," IEEE Transactions on Image Processing, vol.29, pp.4721-4732, 2020. DOI: 10.1109/TIP.2020.2975986
DOI
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J. W. Lee and S. H. Hong, "Real-time Haze Removal Method using Brightness Transformation based on Atmospheric Scatter Coefficient Rate and Local Histogram Equalization," Journal of Korea Multimedia Society, vol.19, no.1, pp.10-21, 2016. DOI: 10.9717/kmms.2016.19.1.010
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H. S. Cho, G. J. Kim, K. H. Jang, S. M. Lee and B. S. Kang, "Color Image Enhancement Based on Adaptive Nonlinear Curves of Luminance Features," JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, vol.15, no.1, pp.60-67, 2015. DOI: 10.5573/JSTS.2015.15.1.060
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S. M. Lee, S. W. Park and B. S. Kang, "Hardware implementation of CIE1931 color coordinate system transformation for color correction," j.inst. Korean.electr.electron.eng, vol.24, no.2, pp.502-506, 2020. DOI: 10.7471/ikeee.2020.24.2.502
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D. Ngo, G. D. Lee and B. S. Kang, "Improved Color Attenuation Prior for Single-Image Haze Removal," Appl. Sci., vol.9, No.19, 2019. DOI: 10.3390/app9194011
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S. M. Lee, D. Ngo and B. S. Kang, "Nonlinear model for estimating depth map of haze removal," j.inst.Korean.electr.electron.eng, vol.24, no.2, pp. 492-496, 2020. DOI: 10.7471/ikeee.2020.24.2.492
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