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http://dx.doi.org/10.7471/ikeee.2020.24.4.1074

Design of digitally controlled CMOS voltage mode DC-DC buck converter for high resolution duty ratio control  

Yoon, KwangSub (Dept. of Electronics Engineering, inha University)
Lee, Jonghwan (Dept. of System Semiconductor Engineering, sangmyung University)
Publication Information
Journal of IKEEE / v.24, no.4, 2020 , pp. 1074-1080 More about this Journal
Abstract
This paper proposes a digitally controlled buck converter insensitive to process, voltage and temperature and capable of three modes of operation depending on the state of the output voltage. Conventional digital-controlled buck converters utilized A/D converters, counters and delay line circuits for accurate output voltage control, resulting in increasing the number of counter and delay line bits. This problem can be resolved by employing the 8-bit and 16-bit bidirectional shift registers, and this design technique leads a buck converter to be able to control duty ratio up to 128-bit resolution. The proposed buck converter was designed and fabricated with a CMOS 180 nano-meter 1-poly 6-metal process, generating an output voltage of 0.9 to 1.8V with the input voltage range of 2.7V to 3.6V, a ripple voltage of 30mV, and a power efficiency of up to 92.3%. The transient response speed of the proposed circuit was measured to be 4us.
Keywords
CMOS; PMIC; DPWM; Buck; Voltage mode;
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Times Cited By KSCI : 1  (Citation Analysis)
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