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http://dx.doi.org/10.7471/ikeee.2022.26.3.437

Automotive Semiconductor Serial Interfaces with Transmission Error Detection Using Cyclic Redundancy Check  

Choi, Ji-Woong (Soongsil University)
Im, Hyunchul (Soongsil University)
Yang, Seonghyun (Soongsil University)
Lee, Donghyeon (Soongsil University)
Lee, Myeongjin (Soongsil University)
Lee, Seongsoo (Soongsil University)
Publication Information
Journal of IKEEE / v.26, no.3, 2022 , pp. 437-444 More about this Journal
Abstract
This paper proposes a CRC error verification method for SPI and I2C buses of automotive semiconductors. In automotive semiconductors, when an error occurs in communication and an incorrect value is transmitted, fatal results may occur. Unlike LIN communication and CAN communication, in communication such as SPI and I2C, there is no frame for detecting an error, so some definitions of new standards are required. Therefore, in this paper, the CRC error detection mode is newly defined in the SPI and I2C communication protocols, and the verification is presented by designing it in hardware.
Keywords
Transmission Error Detection; Serial Interface; Cyclic Redundancy Check; Serial Peripheral Interface Bus; Inter-Integrated Circuit Bus;
Citations & Related Records
Times Cited By KSCI : 3  (Citation Analysis)
연도 인용수 순위
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