Electrical Characteristics and Deep Level Traps of 4H-SiC MPS Diodes with Different Barrier Heights |
Byun, Dong-Wook
(Dept. of Electronic materials Engineering, Kwangwoon University)
Lee, Hyung-Jin (Dept. of Electronic materials Engineering, Kwangwoon University) Lee, Hee-Jae (Dept. of Electronic materials Engineering, Kwangwoon University) Lee, Geon-Hee (Dept. of Electronic materials Engineering, Kwangwoon University) Shin, Myeong-Cheol (Dept. of Electronic materials Engineering, Kwangwoon University) Koo, Sang-Mo (Dept. of Electronic materials Engineering, Kwangwoon University) |
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