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http://dx.doi.org/10.7471/ikeee.2021.25.4.689

The defect detection circuit of an electronic circuit through impedance change detection that induces a change in S-parameter  

Seo, Donghwan (The 2nd Directorate, Defense Test & Evaluation Research Institute, Agency for Defense Development)
Kang, Tae-yeob (The 2nd Directorate, Defense Test & Evaluation Research Institute, Agency for Defense Development)
Yoo, Jinho (Dept. of Electronics Engineering, Soongsil University)
Min, Joonki (The 2nd Directorate, Defense Test & Evaluation Research Institute, Agency for Defense Development)
Park, Changkun (Dept. of Electronics Engineering, Soongsil University)
Publication Information
Journal of IKEEE / v.25, no.4, 2021 , pp. 689-696 More about this Journal
Abstract
In this paper, in order to apply Prognostics and Health Management(PHM) to an electronic system or circuit, a circuit capable of detecting and predicting defect characteristics inside the system or circuit is implemented, and the results are described. In the previous study, we demonstrated that the frequency of the amplitude of S-parameter changed as the circuit defect progressed. These characteristics were measured by network analyser. but in this study, even if the same defect detection method is used, a circuit is proposed to check the progress of the defect, the remaining time, and the occurrence of the defect without large measurement devices. The circuit is designed to detect the change in impedance that generates changes of S-parameter, and it is verified through simulation using the measurement results of Bond-wires.
Keywords
Defect detection; Impedance; Electronic Circuits; S-parameter; Prognostics and Health Management (PHM); Detection circuit;
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