The defect detection circuit of an electronic circuit through impedance change detection that induces a change in S-parameter |
Seo, Donghwan
(The 2nd Directorate, Defense Test & Evaluation Research Institute, Agency for Defense Development)
Kang, Tae-yeob (The 2nd Directorate, Defense Test & Evaluation Research Institute, Agency for Defense Development) Yoo, Jinho (Dept. of Electronics Engineering, Soongsil University) Min, Joonki (The 2nd Directorate, Defense Test & Evaluation Research Institute, Agency for Defense Development) Park, Changkun (Dept. of Electronics Engineering, Soongsil University) |
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