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AEC-Q200 Rev-D, "Failure Mechanism Based Stress Test Qualification For Multichip Modules (MCM) In Automotive Applications," http://www.aecouncil.com/Documents/AEC_Q200_Rev_D_Base_ Document.pdf
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JEDEC Standards & Documents Search, https://www.jedec.org/standards-documents
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Y. Shin and S. Lee, "Compliance Technologies of Electromagnetic Compatibility in Automotive Electronic Systems," j.inst.Korean.electr.electron.eng., vol.22, no.2, pp.506-509, 2018. DOI: 10.7471/ikeee.2018.22.2.506
DOI
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4 |
S. Lee and C. Kim, "Reliability Test for Automotive Semiconductors," the Magazine of the IEIE, vol.46, no.1, pp.39-45, 2019.
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5 |
AEC-Q100 Rev-H, "Failure Mechanism Based Stress Test Qualification For Integrated Circuits," http://www.aecouncil.com/Documents/AEC_Q100_ Rev_H_Base_Document.pdf
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6 |
https://www.rmqsi.org/using-accelerated-life -testing-to-assess-warranty-risk/
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7 |
S. Arrhenius, "Uber die Dissociationswarme und den Einfluss der Temperatur auf den Dissociationsgrad der Elektrolyte," Zeitschrift fur Physikalische Chemie, vol.4, pp.96-116, 1889.
DOI
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8 |
AEC-Q102 Rev-A, "Failure Mechanism Based Stress Test Qualification for Discrete Optoelectronic Semiconductors in Automotive Applications," http://www.aecouncil.com/Documents/AEC-Q102_ Rev_A.pdf
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9 |
http://passionateaboutoss.com/bathtub-curve/
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10 |
AEC-Q101 Rev-E, "Failure Mechanism Based Stress Test Qualification For Discrete Semiconductors," http://www.aecouncil.com/Documents/AEC_Q101_ Rev_E_Base_Document.pdf
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11 |
AEC-Q104, "Stress Test Qualification For Passive Components", http://www.aecouncil.com/Documents/AEC-Q104_Rev-.pdf
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K. Laidler, Chemical Kinetics, 3rd edition, Harper & Row, 1987.
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13 |
AEC-Q103-002, "Failure Mechanism Based Stress Test Qualification for Micro Electro-Mechanical System (MEMS) Pressure Sensor Devices," http://www. aecouncil.com/Documents/AEC_Q103-002_Rev-.pdf
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