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http://dx.doi.org/10.7471/ikeee.2021.25.3.485

Development of Defect Inspection System for Polygonal Containers  

Yoon, Suk-Moon (Dept. Electronic Engineering, Hanbat National University)
Lee, Seung-Ho (Dept. Electronic Engineering, Hanbat National University)
Publication Information
Journal of IKEEE / v.25, no.3, 2021 , pp. 485-492 More about this Journal
Abstract
In this paper, we propose the development of a defect inspection system for polygonal containers. Embedded board consists of main part, communication part, input/output part, etc. The main unit is a main arithmetic unit, and the operating system that drives the embedded board is ported to control input/output for external communication, sensors and control. The input/output unit converts the electrical signals of the sensors installed in the field into digital and transmits them to the main module and plays the role of controlling the external stepper motor. The communication unit performs a role of setting an image capturing camera trigger and driving setting of the control device. The input/output unit converts the electrical signals of the control switches and sensors into digital and transmits them to the main module. In the input circuit for receiving the pulse input related to the operation mode, etc., a photocoupler is designed for each input port in order to minimize the interference of external noise. In order to objectively evaluate the accuracy of the development of the proposed polygonal container defect inspection system, comparison with other machine vision inspection systems is required, but it is impossible because there is currently no machine vision inspection system for polygonal containers. Therefore, by measuring the operation timing with an oscilloscope, it was confirmed that waveforms such as Test Time, One Angle Pulse Value, One Pulse Time, Camera Trigger Pulse, and BLU brightness control were accurately output.
Keywords
Embedded Board; Machine Vision Inspection; Camera Mount Part; Inspection Rotating Part; BLU Part;
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