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http://dx.doi.org/10.7471/ikeee.2019.23.3.1015

A Study on SCR-Based ESD Protection Device with Improved Robustness Using Stack Technology  

Kwak, Jae-Chang (Dept. of Electronics Engineering, Seokyeong University)
Publication Information
Journal of IKEEE / v.23, no.3, 2019 , pp. 1015-1019 More about this Journal
Abstract
In this paper, a new ESD protection device is proposed to improve the trigger voltage and robustness. The HHVSCR and the proposed device were compared to verify the trigger voltage, the holding voltage and the robustness. The gate length was modified to verify the electrical characteristics. The trigger voltage, the holding voltage and the robustness were certified by comparing the proposed device and the stacking structure.
Keywords
HHVSCR; Stack; Trigger voltage; Holding voltage; Robustness;
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