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http://dx.doi.org/10.7471/ikeee.2018.22.4.941

Failure analysis of capacitor for sub-module in HVDC  

Kang, Feel-soon (Dept. of Electronics and Control Engineering, Hanbat National University)
Song, Sung-Geun (Energy conversion research center, Korea Electronics Technology Institute)
Publication Information
Journal of IKEEE / v.22, no.4, 2018 , pp. 941-947 More about this Journal
Abstract
In general, capacitors have a large influence on the life of the system due to frequent charging and discharging. In this paper, we analyze the cause of the core failure of high voltage, high current HVDC sub-module film capacitor and analyze the precautions of the capacitor design and manufacturing process. First, the cause of the fault, the failure mode, and the effect are analyzed through the FMEA of the capacitor. To quantitatively evaluate the causes and effects of faults that have the greatest effect on the failure of a capacitor, a fault tree for the capacitor is presented and the failure rate is analyzed according to the design parameters and the driving conditions. It is verified that the main cause of capacitor failure is the capacitance change, and it is necessary to minimize the temperature rise, corona occurrence, electrode expansion, and insulation distance decrease during capacitor design and manufacturing process in order to reduce the failure rate of the capacitor.
Keywords
Capacitors; Failure rate; FMEA(Failure Modes and Effect Analysis); FTA(Fault-tree analysis); HVDC (High Voltage Direct Current);
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