A Study on a New ESD Protection Circuit with Parasitic PNP BJT Insertion Type with High Robustness Characteristics Based on SCR
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Chae, Hee-Guk
(Dept. of Electronics Engineering, DanKook Unversity)
Do, Kyoung-Il (Dept. of Electronics Engineering, DanKook Unversity) Seo, Jeong-Yun (Dept. of Electronics Engineering, DanKook Unversity) Seo, Jeong-Ju (Dept. of Electronics Engineering, DanKook Unversity) Koo, Yong-Seo (Dept. of Electronics Engineering, DanKook Unversity) |
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