Effect of Random Dopant Fluctuation Depending on the Ion Implantation for the Metal-Oxide-Semiconductor Field Effect Transistor
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Park, Jae Hyun
(Dept. of Semiconductor Systems Engineering, Korea University)
Chang, Tae-sig (Dept. of Semiconductor Systems Engineering, Korea University) Kim, Minsuk (Dept. of Electrical Engineering, Korea University) Woo, Sola (Dept. of Electrical Engineering, Korea University) Kim, Sangsig (Dept. of Electrical Engineering, Korea University) |
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