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http://dx.doi.org/10.7471/ikeee.2017.21.1.7

Study on the SCR-based ESD Protection Circuit Using the Segmentation Layout Technique with High Holding Voltage  

Park, Jun-Geol (Dept. of Electronics Engineering, DanKook Unversity)
Do, Kyoung-Il (Dept. of Electronics Engineering, DanKook Unversity)
Chae, Hee-Guk (Dept. of Electronics Engineering, DanKook Unversity)
Seo, Jeong-Yun (Dept. of Electronics Engineering, DanKook Unversity)
Koo, Yong-Seo (Dept. of Electronics Engineering, DanKook Unversity)
Publication Information
Journal of IKEEE / v.21, no.1, 2017 , pp. 7-12 More about this Journal
Abstract
This paper proposed the ESD protection circuit for the high-voltage applications with latch-up immunity and high area efficiency. The proposed circuit has high holding voltage compared to the conventional SCR by inserting the floating regions and applying the segmentation layout. It has the area efficiency is more higher due to the segmentation layout. The proposed circuit has the higher holding voltage of the 21.67V than the 3.39V of the conventional SCR. The electrical characteristics of the proposed circuit was investigated by TCAD simulator, and was proved through the fabrication by using the 0.18 BCD process.
Keywords
ESD; SCR; Holding Voltage; SCR; Segmentation Layout;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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