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http://dx.doi.org/10.7471/ikeee.2015.19.1.094

50V Power MOSFET with Improved Reverse Recovery Characteristics Using an Integrated Schottky Body Diode  

Lee, Byung-Hwa (Dept. of Electronics Engineering, Sogang University)
Cho, Doo-Hyung (Dept. of Electronics Engineering, Sogang University)
Kim, Kwang-Soo (Dept. of Electronics Engineering, Sogang University)
Publication Information
Journal of IKEEE / v.19, no.1, 2015 , pp. 94-100 More about this Journal
Abstract
In this paper, 50V power U-MOSFET which replace the body(PN) diode with Schottky is proposed. As already known, Schottky diode has the advantage of reduced reverse recovery loss than PN diode. Thus, the power MOSFET with integrated Schottky integrated can minimize the reverse recovery loss. The proposed Schottky body diode U-MOSFET(SU-MOS) shows reduction of reverse recovery loss with the same transfer, output characteristic and breakdown voltage. As a result, 21.09% reduction in peak reverse current, 7.68% reduction in reverse recovery time and 35% improvement in figure of merit(FOM) are observed when the Schottky width is $0.2{\mu}m$ and the Schottky barrier height is 0.8eV compared to conventional U-MOSFET(CU-MOS). The device characteristics are analyzed through the Synopsys Sentaurus TCAD tool.
Keywords
Power MOSFET; Reverse recovery; Leakage current; Schottky diode; U-MOSFET;
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