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http://dx.doi.org/10.7467/KSAE.2014.22.7.023

Development of a Headlamp Testing System for Automobile Headlamp Beam Pattern Recognition  

Kim, Junghoon (Institute of e-Vehicle Technology, University of Ulsan)
Cho, Chiwoon (School of Industrial Engineering, University of Ulsan)
Publication Information
Transactions of the Korean Society of Automotive Engineers / v.22, no.7, 2014 , pp. 23-30 More about this Journal
Abstract
"Cut off line" in automotive passing beam has very important safety function because it serves for headlamp aiming. Headlights that are aimed incorrectly will not only perform poorly but also offend oncoming traffic. In addition, an objective definition of cut off line in low beam is necessary, since a requirement for correct aiming of the beams is specified within all the existing regulations. Accordingly, headlight regulations are requirements that automobiles must satisfy in order to be sold in a particular country. In this study, a more advanced recognition method for the cut off lines of the various headlamps commonly used in Europe, North America, and domestic is suggested and a headlamp testing system is developed to adjust the beam to the country-specific regulation. This system uses image processing technology to detect the cut off lines in the beam patterns of halogen headlamps, high-intensity discharge headlamps, and light-emitting diode headlamps as well.
Keywords
Headlamp; Cut off line; Headlamp testing system;
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