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http://dx.doi.org/10.5012/jkcs.2014.58.1.9

Growth Kinetics and Electronic Properties of Passive Film of Nickel in Borate Buffer Solution  

Kim, Younkyoo (Department of Chemistry, College of Natural Science, Hankuk University of Foreign Studies)
Publication Information
Abstract
In a borate buffer solution, the growth kinetics and the electronic properties of passive film on nickel were investigated, using the potentiodynamic method, chronoamperometry, and single- or multi-frequency electrochemical impedance spectroscopy. The oxide film formed during the passivation process of nickel has showed the electronic properties of p-type semiconductor, which follow from the Mott-Schottky equation. It was found out that the passive film ($Ni(OH)_2$) of Ni formed in the low electrode potential changes to NiO and NiO(OH) while the electrode potential increases.
Keywords
Nickel; Corrosion; Passivation; p-Type semiconductor; Mott-Schottky;
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1 Sikora, E.; Macdonald, D. D. Electrochim. Acta 2002, 48,69.   DOI   ScienceOn
2 Nakaoka, K.; Ueyama, J.; Ogura, K. J. Electroanal. Chem. 2004, 571, 93.   DOI   ScienceOn
3 Jang, H.; Park, C.; Kwon, H. Electrochim. Acta. 2005, 50,3503.   DOI   ScienceOn
4 Darowocki, K.; Krakowiak, S.; Slepski, P. Electrochim. Acta 2006, 51, 2204.   DOI   ScienceOn
5 Medway, S. L.; Lucas, C. A.; Kowal, A.; Nichols, R. J.; Johnson, D. J. Electroanal. Chem. 2006, 587, 172.   DOI   ScienceOn
6 Iida, M.; Ohtsuka, T. Corr. Sci. 2007, 49, 1408.   DOI   ScienceOn
7 Menga, G.; Suna, F.; Shao, Y.; Zhang, T.; Wang, F.; Dong, C.; Li, X. Electrochim. Acta 2010, 55, 2575.   DOI   ScienceOn
8 Grubac, Z.; Petrovic, Z.; Katic, J.; Metikos-Hukovic, M.; Babic, R. J. Electroanal. Chem. 2010, 645, 87.   DOI   ScienceOn
9 Park, K.; Ahn, S.; Kwon, H. Electrochim. Acta 2011, 56,1662.   DOI   ScienceOn
10 Massoud, T.; Maurice, V.; Klein, L.H.; Wiame, F.; Marcus, Philippe. Corr. Sci. 2013, 69, 245.   DOI   ScienceOn
11 Kim, Y. J. Korean Chem. Soc. 2013, 57(5), 533.   DOI   ScienceOn
12 Chon, J.-K.; Kim, Y. J. Korean Chem. Soc. 2010, 54(4), 380.   DOI
13 Kim, J.; Pyun, S. Electrochim. Acta 1995, 40, 1863.   DOI   ScienceOn
14 Gebert, A.; Wolff, U.; John, A.; Eckert, J.; Schultz, L. Mater. Sci. Eng. A 2001, 299, 125.   DOI   ScienceOn
15 Flis, J.; Flis-Kabulska, I.; Zkrczymski, T. Electrochim. Acta 2009, 54, 1810.   DOI   ScienceOn
16 Chung, S.; Kim, Y. J. Korean Chem. Soc. 2012, 56(1), 47.   DOI   ScienceOn
17 Rao, K. B.; Smakula, A. J. Appl. Phys. 1965, 36, 1031.   DOI
18 Chen, H.; Lu, Y.; Hwang, W. Thin Solid Films 2006, 498,266.   DOI   ScienceOn
19 Peskov, Y. V. Electric double layer on semiconductor electrode. In Comprehensive Treatise of Electrochemistry; Bockris, J.O'M., Conway, B.E., Yeager, E., Eds.; Plenum Press: New York, 1980; Vol. 1, Chapter 6.
20 Albu, C.; Deconinck, D.; Hotoiu, L.; Deconinck, J.; Topa, V. Electrochim. Acta 2013, 89, 114.   DOI   ScienceOn