Characterization of a Membrane Interface for Analysis of Air Samples Using Time-of-flight Mass Spectrometry |
Jang, Yu-Mi
(Department of Chemistry and Institute of Nanoscience & Tech., Wonkwang University)
Oh, Jun-Sik (Department of Chemistry and Institute of Nanoscience & Tech., Wonkwang University) Park, Chang-Joon (Korea Research Institute of Standards and Science) Yang, Sang-Sik (Division of Electrical & Computer Engineering, Ajou University) Jung, Kwang-Woo (Department of Chemistry and Institute of Nanoscience & Tech., Wonkwang University) |
1 | Lide, D. R. CRC Handbook of Chemistry and Physics, 81th ed.; CRC Press: London, 2000. |
2 | LaPack, M. A.; Tou, J. C.; Enke, C. G. Anal. Chem. 1990, 62, 1265. DOI |
3 | Boscaini, E.; Alexander, M. L.; Prazeller, P.; Märk, T. D. Int. J. Mass Spectrom. 2004, 239, 179. DOI ScienceOn |
4 | Miranda, L. D.; Short, R. T.; van Amerom, F. H. W.; Bell, R. J.; Byrne, R. H. J. Membr. Sci. in press. |
5 | Ketola, R. A.; Ojala, M.; Sorsa, H.; Kotiaho, T.; Kostiainen, R. Anal. Chim. Acta 1997, 349, 359. DOI ScienceOn |
6 | Bae, Y. J.; Yoon, S. H.; Moon, J. H.; Kim, M. S. Bull. Korean Chem. Soc. 2010, 31, 92. DOI ScienceOn |
7 | Song, K.; Cha, H.; Kim, D.; Min, K. Bull. Korean Chem. Soc. 2004, 25, 101. DOI ScienceOn |
8 | Alexander, M. A.; Boscaini, E.; Lindinger, W.; Märk, T. D. Int. J. Mass Spectrom. 2003, 223-224, 763. DOI ScienceOn |
9 | Hansen, K. F.; Gylling, S.; Lauritsen, F. R. Int. J. Mass Spectrom. 1996, 152, 143. DOI ScienceOn |
10 | Dongré, A. R.; Hayward, M. J. Anal. Chim. Acta 1996, 327, 1. DOI ScienceOn |
11 | Kim, T.-K.; Jung, K.-H.; Yoo, S.-K.; Jung, K.-W. Bull. Korean Chem. Soc. 2005, 26, 303. DOI ScienceOn |
12 | Jung, K.-W.; Choi, S. S.; Jung, K.-H. Rev. Sci. Instrum. 1991, 62, 2125. DOI |
13 | NIST Standard Reference Database 69; November 1998 Release: NIST Chemistry WebBook. |
14 | Watson, J. M.; Payne, P.A. J. Membr. Sci. 1990, 49, 171. DOI ScienceOn |
15 | Tsai, G.-J.; Austin, G. D.; Syu, M. J.; Tsao, G. T.; Hayward, M. J.; Kotiaho, T.; Cooks, T. G. Anal. Chem. 1991, 63, 2460. DOI |
16 | Pasternak, R. A.; Schimscheimer, J. F.; Heller, J. J. Polym. Sci. 1970, 8, 467. DOI |
17 | Overney, F. L.; Enke, C. G. J. Am. Soc. Mass Spectrom. 1996, 7, 93. DOI ScienceOn |
18 | Oh, K.-S.; Koo, Y.-M.; Jung, K.-W. Int. J. Mass Spectrom. 2006, 253, 65. DOI ScienceOn |
19 | Lauritsen, F. R.; Bohatka, S.; Degn, H. Rapid Commun. Mass Spectrom. 1990, 4, 401. DOI |
20 | Sigma Aldrich Technical Information Bulletin: Mineral adsorbents, filter agents, and drying agents, http://www.sigmaaldrich.com/chemistry/aldrich-chemistry/tech-bulletins/al-143.html |
21 | Ketola, R. A.; Kotiaho, T.; Cisper, M. E.; Allen, T. M. J. Mass Spectrom. 2002, 37, 457. DOI ScienceOn |
22 | Viktorova, O. S.; Kogan, V. T.; Manninen, S. A.; Kotiaho, T.; Ketola, R. A.; Dubenskii, B. M.; Parinov, S. P.; Smirnov, O. V. J. Am. Soc. Mass Spectrom. 2004, 15, 823. DOI ScienceOn |
23 | Janes, D. W.; Durning, C. J.; van Pel, D. M.; Lynch, M. S.; Gill, C. G.; Krogh, E. T. J. Membr. Sci. 2008, 325, 81. DOI ScienceOn |
24 | Schlueter, M.; Gentz, T. J. Am. Soc. Mass Spectrom. 2008, 19, 1395. DOI ScienceOn |
25 | Frandsen, H.; Janfelt, C.; Lauritsen, F. R. Rapid Commun. Mass Spectrom. 2007, 21, 1574. DOI ScienceOn |
26 | Oser, H.; Coggiola, M. J.; Young, S. E.; Crosley, D. R.; Hafer, V.; Grist, G. Chemosphere 2007, 67, 1701. DOI ScienceOn |
27 | Mendes, M. A.; Eberlin, M. N. Analyst 2000, 125, 21. DOI ScienceOn |
28 | Sysoev, A. A.; Ketola, R. A.; Mattila, I.; Tarkiainen, V.; Kotiaho, T. Int. J. Mass Spectrom. 2001, 212, 205. DOI ScienceOn |
29 | Maden, A. J.; Hayward, M. J. Anal. Chem. 1996, 68, 1805. DOI ScienceOn |
30 | Allen, T. M.; Falconer, T. M.; Cisper, M. E.; Borgerding, A. J.; Wilkerson, C. W., Jr. Anal. Chem. 2001, 73, 4830. DOI ScienceOn |
31 | Moxom, J.; Reilly, P. T. A.; Whitten, W. B.; Ramsey, J. M. Anal. Chem. 2003, 75, 3739. DOI ScienceOn |
32 | White, A. J.; Blamire, M. G.; Corlett, C. A.; Griffiths, B. W.; Martin, D. M.; Spencer, S. B.; Mullock, S. J. Rev. Sci. Instrum. 1998, 69, 565. DOI ScienceOn |
33 | Yoon, T. O.; Choi, C. M.; Kim, H. J.; Kim, N. J. Bull. Korean Chem. Soc. 2007, 28, 619. DOI ScienceOn |
34 | Sinha, M. P.; Tomassian, A. D. Rev. Sci. Instrum. 1991, 62, 2618. DOI |
35 | Wiley, W. C.; McLaren, I. H. Rev. Sci. Instrum. 1955, 26, 1150. DOI |
36 | Jonsson, J. A. 2003, 57, S/317. |
37 | Mitra, S.; Kebbekus, B. Environmental Chemical Analysis; Chapman and Hall/CRC: Boca Raton, Florida, 1998. |
38 | Melita, L.; Popescu, M. J. Membr. Sci. 2008, 312, 157. |
39 | Hendren, Z. D.; Brant, J.; Wiesner, M. R. J. Membr. Sci. 2009, 331, 1. DOI ScienceOn |
40 | Johnson, R. C.; Cooks, R. G.; Allen, T. M.; Cisper, M. E.; Hemberger, P. H. Mass Spectrom. Rev. 2000, 19, 1. DOI ScienceOn |