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http://dx.doi.org/10.17661/jkiiect.2021.14.5.438

A Study on the Characteristics of CdS Thin Film by Annealing Time Change  

Chung, Jae-Pil (Department of Electronic Engineering, Gachon University)
Park, Jung-cheul (Department of Electronic Engineering, Gachon University)
Publication Information
The Journal of Korea Institute of Information, Electronics, and Communication Technology / v.14, no.5, 2021 , pp. 438-443 More about this Journal
Abstract
This paper uses a multiplex deposition sputter system and aims to improve transmittance and reduce production costs by depositing a CdS thin film on an ITO glass substrate. When manufacturing CdS thin films, we wanted to find excellent conditions when manufacturing solar cells by changing heat treatment time. It was observed that thickness and sheet resistance were not significantly different depending on heat treatment time changes. The specific resistance was measured from a minimum of 6.68 to a maximum of 6.98. When the heat treatment time was more than 20 minutes, the transmittance was measured to be more than 75%. When the heat treatment time was 10 minutes, the bandgap was 3.665 eV and more than 20 minutes was 3.713 eV, which was measured as the same result. The XRD analysis showed that the structure of CdS was hexagonal and only CdS thin films were deposited without any other impurities. The result of calculating the FWHM was a maximum of 0.142 when the heat treatment time was 20 minutes, and a minimum of 0.133 when the heat treatment time was 40 minutes, so there was no significant difference in the FWHM when the heat treatment time was changed. The particle size was measured at 11.65 Å when the heat treatment time was 40 minutes, and at 10.93 Å when the heat treatment time was 20 minutes.
Keywords
CdS thin film; ITO glass; multiplex deposition sputter system; solar cells; transmittance;
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