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http://dx.doi.org/10.17661/jkiiect.2018.11.6.742

Design of Zero-Layer FTP Memory IP  

Ha, Yoongyu (Department of Electronic Engineering, Changwon National University)
Jin, Hongzhou (Department of Electronic Engineering, Changwon National University)
Ha, Panbong (Department of Electronic Engineering, Changwon National University)
Kim, Younghee (Department of Electronic Engineering, Changwon National University)
Publication Information
The Journal of Korea Institute of Information, Electronics, and Communication Technology / v.11, no.6, 2018 , pp. 742-750 More about this Journal
Abstract
In this paper, in order to enable zero-layer FTP cell using only 5V MOS devices on the basis of $0.13{\mu}m$ BCD process, the tunnel oxide thickness is used as the gate oxide thickness of $125{\AA}$ of the 5V MOS device at 82A. The HDNW layer, which is the default in the BCD process, is used. Thus, the proposed zero layer FTP cell does not require the addition of tunnel oxide and DNW mask. Also, from the viewpoint of memory IP design, a single memory structure which is used only for trimming analog circuit of PMIC chip is used instead of the dual memory structure dividing into designer memory area and user memory area. The start-up circuit of the BGR (Bandgap Reference Voltage) generator circuit is designed to operate in the voltage range of 1.8V to 5.5V. On the other hand, when the 64-bit FTP memory IP is powered on, the internal read signal is designed to maintain the initial read data at 00H. The layout size of the 64-bit FTP IP designed using the $0.13-{\mu}m$ Magnachip process .is $485.21{\mu}m{\times}440.665{\mu}m$($=0.214mm^2$).
Keywords
PMIC; Zero layer; Few-Time Programmable; Single memory; BGR; Power-on reset;
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Times Cited By KSCI : 1  (Citation Analysis)
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