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http://dx.doi.org/10.17661/jkiiect.2017.10.4.325

Comparative Analysis of Protocol Test Sequence Generation Methods for Conformance Testing  

Kim, Chul (Department of Computer Science, Yongin University)
Publication Information
The Journal of Korea Institute of Information, Electronics, and Communication Technology / v.10, no.4, 2017 , pp. 325-332 More about this Journal
Abstract
In this paper, a survey of test sequence generation methods for testing the conformance of a protocol implementation to its specification is presented. The best known methods proposed in the literature are called transition tour, distinguishing sequence, characterizing sequence, and unique input/output sequence. Also, several variants of the above methods are introduced. Applications of these methods to the finite state machine model are discussed. Then, comparative analysis of the methods is made in terms of test sequence length. Finally, conclusions are given as follows. The T-method produces the shortest test sequence, but it has the worst fault coverage. The W-method tends to produce excessively long test sequences even though its fault coverage is complete. The problem with the DS-method is that a distinguishing sequence may not exist. The UIO-method is more widely applicable, but it does not provide the same fault coverage as the DS-method.
Keywords
conformance testing; finite state machine; implementation under test; lower tester; test sequence; upper tester;
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