Browse > Article

TFT-LCD Defect Detection Using Double-Self Quotient Image  

Park, Woon-Ik (경북대학교 전자전기컴퓨터학과)
Lee, Kyu-Bong (경북대학교 전자전기컴퓨터학과)
Kim, Se-Yoon (경북대학교 전자전기컴퓨터학과)
Park, Kil-Houm (경북대학교 전자전기컴퓨터학과)
Publication Information
Journal of KIISE:Computing Practices and Letters / v.14, no.6, 2008 , pp. 604-608 More about this Journal
Abstract
The TFT-LCD image allows non-uniform illumination variation and that is one of main difficulties of finding defect region. The SQI (self quotient image) has the HPF (high pass filter) shape and is used to reduce low frequency-lightness component. In this paper, we proposed the TFT-LCD defect-enhancement algorithm using characteristics of the SQI, that is the SQI has low-frequency flattening effect and maintains local variation. The proposed method has superior flattening effect and defect-enhancement effect compared with previous the TFT-LCD image preprocessing.
Keywords
TFT-LCD; TFT-LCD Defect Detection; Self Quotient Image;
Citations & Related Records
연도 인용수 순위
  • Reference
1 B. C. Jiang, C. C. Qang and H. C. Liu, "Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques," International Journal of Production Research, Vol.43, No.1, pp.67-80, 2005   DOI   ScienceOn
2 Haitao Wang, Stan Z Li, Yangsheng Wang, "The Quotient Image: Class-Based Re-Rendering and ecognition with Varying Illuminations," IEEE Trans. Pattern Analysis and Machine Intelligence, Vol.23, No.2, pp.129-139. FEB. 2001   DOI   ScienceOn
3 Haitao Wang, Stan Z Li, Yangsheng Wang, "Generalized Quotient Image," IEEE Computer Society Conference on Computer Vision and Pattern Recognition. (CVPR'04), Vol.2. pp.498-505. 2004
4 Seung-Il Baek, Woo-Seob, Tak-mo Koo, Il Choi and Kil-Houm Park," INSPECTION OF DEFECT ON LCD PANEL USING POLYNOMIAL APPROXIMATION," TENCON 2004. IEEE Region 10 Conference Vol.A. 21-24 pp. 235-238. Nov. 2004
5 C-J Lu and D-M TSAI, "Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sun-image-based singurla value decomposition," International Journal of Production Research, Vol.42, No.20, pp. 4331-4351, Oct., 2004   DOI   ScienceOn
6 Haitao Wang, Stan Z Li, Yangsheng Wang, "Face Recognition under Varying Lighting Conditions Using Self Quotient Image," Proc. IEEE International Conference on Automatic Face and Gesture Recognition(FGR'04) pp.819-824. 2004
7 Kyung-shik Jang, "Defect Inspection of the Polarizer Film Using Statistical Texture Analysis," 情報通信硏究所, 情報通信硏究誌 第7輯 2006. 2. pp.113-117
8 Rafael C. Gonzalez, Richard E. Woods "Digital Image Processing second edition," pp.363-372, 2002
9 Jae Y. Lee and Suk I. Yoo, "Automatic Detection of Region-Mura Defect in TFT-LCD," IEICE Trans. Inf. & Syst., Vol.E87-D, No.10, pp. 2371-2378, 2004
10 J.H. Oh, D.M. Kwak, K. B Lee, et al. "Line defect detection in TFT-LCD using directional filter bank and adaptive multilevel thresholding:, Key Engineering Materials, pp.270-273, 233-238 2004