A Method of Selecting Test Metrics for Certifying Package Software using Bayesian Belief Network |
Lee, Chong-Won
(서울대학교 전기.컴퓨터공학부)
Lee, Byung-Jeong (서울시립대학교 컴퓨터공학부) Oh, Jae-Won (삼성전자 모바일연구소) Wu, Chi-Su (서울대학교 전기.컴퓨터공학부) |
1 | Lee, C., Oh, J., Lee, B., and Wu, C., 'Selecting metrics for package software certification using Formal Concept Analysis,' In Proc. of 2nd International Conference on Software Engineering Research & Applications (SERA '04), pp, 291-297, May 2004 |
2 | Oh, J., Lee, B., Park, D., Lee, J., Hong, E., and Wu, C., 'Using hierarchical classification to certify software packages,' In Proc. of 1st ACIS International Conference on Software Engineering Research & Applications (SERA '03), pp. 270-275, 2003 |
3 | Lauritzen, S. J., and Spiegelhalter, D. J. 'Local computations with probabilities on graphical structures and their application to expert systems (with discussion),' J. R. Statistical Society Series B, Vol. 50, No. 2, pp. 157-224, 1988 |
4 | Ziv, H., and Richardson, D., 'Bayesian confirmation of software testing uncertainties,' In Proc. of International Conference on Software Maintenance, Sep, 1997 |
5 | Basili, V. R., and Boehm, B., 'COTS-based systems top 10 list,' IEEE Computer, Vol. 34, No.5, pp. 91-95, May 2001 DOI ScienceOn |
6 | Dick, S., and Kandel, A., 'Fuzzy clustering of software metrics,' In Proc. of The 12th IEEE International Conference on Fuzzy Systems 2003, FUZZ '03, Vol. 1, pp. 642-647, May 2003 DOI |
7 | Voas, J., 'Limited software warranties,' In Proc. of 7th IEEE International Conference and Workshop on the Engineering of Computer Based Systems, pp. 56-61, 2000 DOI |
8 | ISO/IEC, 'DTR 9126-2: Software Engineering - Product quality Part 2 - External metrics,' ISO/ IEC JTC1/SC7 N2419, 2001 |
9 | Fenton, N. E., and Neil, M., 'Software metrics: Roadmap,' The Future of Software Engineering, Anthony Finkelstein (Ed.), ACM Press 2000 DOI |
10 | Jones, C., Software Assessments, Benchmarks, and Best Practices, New York: Addison-Wesley, 2000 |
11 | Heckerman, D., 'A tutorial on learning with Bayesian networks,' Technical Report MSR-TR95-06, Microsoft Research, Redmond, WA, 1995 |
12 | Fenton, N. E., and Neil, M., 'A critique of software defect prediction models,' IEEE Transactions on Software Engineering, Vol. 25, No. 5, pp. 675-689, Sep./Oct. 1999 DOI ScienceOn |
13 | Telecommunications Technology Association (TTA), 'Standard for a classification scheme of software reuse,' TTAS.KO-11.0026, 2000 |
14 | Friedman, M. A., and Voas, J. M., Software Assessment: Reliability, Safety, Testability, New York: John Wiley & Sons, Inc., 1995 |
15 | Boehm, B., 'Managing software productivity and reuse,' IEEE Computer, Vol. 32, No. 9, pp. 111-113, Sep. 1999 DOI ScienceOn |
16 | Sommerville, I., Software Engineering (7th Ed.), Addison Wesley, 2004 |
17 | Fenton, N., Krause, P., and Neil, M., 'Software measurement: uncertainty and causal modeling,' IEEE Software, Vol. 19, No. 4, pp. 116-122, Jul./Aug. 2002 DOI ScienceOn |
18 | Mitchell, M. T., Machine Learning, McGraw-Hill, 1997 |
19 | Neil, M., and Fenton, N. E., 'Predicting software quality using Bayesian belief networks,' In Proc. of 21st Anniversary Software Engineering Workshop, NASA Goddard Space Flight Centre, pp, 217-230. Dec. 1996 |
20 | Alexiuk, M. D., and Pizzi, N. J., 'Discriminatory software metric selection via a grid of interconnected multilayer perceptrons,' In Proc. of Canadian Conference on Electrical and Computer Engineering, Vol. 2, pp. 1131-1134, May 2003 DOI |
21 | 김용대, 베이지안 통계학, 자유아카데미, 2000 |
22 | Vivanco, R. A., and Pizzi, N. J., 'Identifying effective software metrics using genetic algorithms,' In Proc. of Canadian Conference on Electrical and Computer Engineering, Vol. 2, pp. 1305-1308, 2003 DOI |