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Test Data Selection Technique to Detect Interaction Faults in Embedded System  

성아영 (이화여대 컴퓨터학과)
최병주 (이화여대 컴퓨터학과)
Publication Information
Journal of KIISE:Software and Applications / v.30, no.12, 2003 , pp. 1149-1157 More about this Journal
Abstract
As an Embedded system combining hardware and software gets more complicated, the importance of the embedded software test increases. Especially, it is mandatory to test the embedded software in the system which has high safety level. In embedded system, it is necessary to develop a test technique to detect faults in interaction between hardware and software. In this paper, we propose a test data selection technique using a fault injection technique for the faults in interaction between hardware and software in embedded system and we apply our technique to the Digital Plant Protection System and analyze effectiveness of the proposed technique through experiments.
Keywords
DPPS; Embedded System; Hardware Fault; Software Fault; Software Test; DPPS;
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1 Charlse R. Yount 91, A Methodology for the Rapid Injection of Transient Hardware Errors, IEEE Transactions on Computers, VOL. 45. No.8, Aug, 1996   DOI   ScienceOn
2 Dimiter Avresky, Fault Injection for formal testing of fault tolerance, IEEE Transactions on Reliability, VOL. 45, NO.3, Sept, 1996   DOI   ScienceOn
3 J.V. Carreira, Fault Injection spot-checks computer system dependability, IEEE Spectrum, Aug, 1999   DOI   ScienceOn
4 J.V. Carreira, Xeption : A technique for the Experimental Evaluation of Dependability in modem computers, IEEE Transaction on Software Engineering. VOL 23, No.2, Feb, 1998   DOI   ScienceOn
5 E. A. Lee, What's Ahead for Embedded Software?, IEEE Computer, pp 18-26, September, 2000   DOI   ScienceOn
6 T. A. Delong, A Fault Injection Technique for VHDL Behavioral-Level Models, IEEE Design and Test of Computers, 1996, pp24-33   DOI   ScienceOn
7 Johan Karsson, Using Heavy-ion Radiation to validate fault-handling mechanisms, IEEE micro, 1994, pp8-23   DOI   ScienceOn
8 Marcello Dalpasso, Fault Simulation of parametric Bridging Faults in CMOS ICs, IEEE Transaction on computer aided design of integrated circuits and systems, vol 12. no. 9, Sept, 1993   DOI   ScienceOn
9 J. Voas, Certifying software for high assurance environments, IEEE Software, Jul/Aug, 1999, pp48-54   DOI   ScienceOn
10 Paul C. Jorgensen, Software Testing - A Craftsman's Approach, CRC Press, 1995
11 Li, N., Malaiya, Y. K., Denton J, 'Estimating the Number of Defects: A Simple and Intuitive Approach,' in Proceeding of 7th International Symposium on Software Reliability Engineering, 1998
12 E. A. Lee, 'Computing for embedded systems,' proceeding of IEEE Instrumentation and Measurement Technology Conference, Budapest, Hungary, May, 2001
13 J.F. Clark, Fault Injection, Computer, June, 1995, pp47-56
14 Mattias O'Nils and Axel Jantsch, 'Communication in Hardware/Software Embedded Systems-A Taxonomy and Problem Formulation,' in Proceeding of 15th NORCHIP Conference, November, 1997
15 J.R. Horgan and S. London, 'ATAC : A data flow coverage testing tool for C,' in Proceedings of Symposium on Assessment of Quality Software Development Tools, pp2-10, New Orleans, LA, May, 1992   DOI
16 M.R. Lyu, J.R. Horgan and S. London, 'A coverage analysis tool for the effectiveness of software testing,' in Proceeding of International Symposium on Software Reliability Engineering, 1993   DOI
17 Jean Alert 외, Validation Based Development of dependable systems, IEEE micro, Jul, 1999, pp 66-79   DOI   ScienceOn
18 Burr, Kevin and Young, William, 'Combinatorial Test Techniques: Table-Based Automation, Test Generation, and Test Coverage,' in Proceeding of International Conference on Software Testing, Analysis, and Review. San Diego, CA, October, 1998
19 Gwan S. Choi, Simulated Fault Injection : A Methodology to Evaluate Fault Tolerant Microprocessor Archtecture, IEEE Transactions on Reliability, VOL. 39, NO.4, Oct, 1990   DOI   ScienceOn
20 M.Hsueh, Fault Injection Techniques and Tools, Computer, Apr, 1997, pp75-82   DOI   ScienceOn
21 M. E. Delamaro, J. C. Maldonado, and A. P. Mathur., 'Integration Testing Using Interface Mutation,' In Proceedings of International Symposium on Software Reliability Engineering (ISSRE '96), pages 112--121, April 1996   DOI
22 Richard A. DeMillo, Richard J. Lipton, and Frederick G. Sayward, Hints on test data selection: Help for the practicing programmer. IEEE Computer, 11(4):34-41, April 1978   DOI   ScienceOn
23 UCN 3&4 Final Safety Analysis Report, Volume 11, Korea Electric Power Corporations