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http://dx.doi.org/10.3745/KTCCS.2014.3.5.129

Built-In Self Repair for Embedded NAND-Type Flash Memory  

Kim, Tae Hwan (숭실대학교 컴퓨터학과)
Chang, Hoon (숭실대학교 컴퓨터학부)
Publication Information
KIPS Transactions on Computer and Communication Systems / v.3, no.5, 2014 , pp. 129-140 More about this Journal
Abstract
BIST(Built-in self test) is to detect various faults of the existing memory and BIRA(Built-in redundancy analysis) is to repair detected faults by allotting spare. Also, BISR(Built-in self repair) which integrates BIST with BIRA, can enhance the whole memory's yield. However, the previous methods were suggested for RAM and are difficult to diagnose disturbance that is NAND-type flash memory's intrinsic fault when used for the NAND-type flash memory with different characteristics from RAM's memory structure. Therefore, this paper suggests a BISD(Built-in self diagnosis) to detect disturbance occurring in the NAND-type flash memory and to diagnose the location of fault, and BISR to repair faulty blocks.
Keywords
NAND-type Flash Memory; BISD; BISR; Diagnosis Algorithm; Redundancy Analysis;
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