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http://dx.doi.org/10.3745/KIPSTD.2010.17D.2.147

Conformance Test Scenario Extraction Techniques for Embedded Software using Test Execution Time  

Park, In-Su (삼성전자 무선사업부)
Shin, Young-Sul (경북대학교 전자전기컴퓨터학부)
Ahn, Sung-Ho (한국전자통신연구원 대경권연구센터 자동차SW플랫폼연구팀)
Kim, Jin-Sam (한국전자통신연구원 대경권연구센터 자동차SW플랫폼연구팀)
Kim, Jae-Young (한국전자통신연구원 대경권연구센터 자동차SW플랫폼연구팀)
Lee, Woo-Jin (경북대학교 IT대학 컴퓨터학부)
Publication Information
The KIPS Transactions:PartD / v.17D, no.2, 2010 , pp. 147-156 More about this Journal
Abstract
Conformance testing for embedded software is to check whether software was correctly implemented according to software specification or not. In conformance testing, test scenarios must be extracted to cover every test cases of software. In a general way, test scenarios simply focus on testing all functions at least one time. But, test scenarios are necessary to consider efficiency of test execution. In this paper, we propose a test scenario extraction method by considering function's execution time and waiting time for user interaction. A test model is a graph model which is generated from state machine diagram and test cases in software specification. The test model is augmented by describing test execution time and user interaction information. Based on the test model, test scenarios are extracted by a modified Dijkstra's algorithm. Our test scenario approach can reduce testing time and improve test automation.
Keywords
Test Scenario; Conformance Test; Embedded Software;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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