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http://dx.doi.org/10.3745/KIPSTD.2006.13D.7.923

Design and Application of the TFM Based System Test Model for the Weapon System Embedded Software  

Kim, Jae-Hwan (국방대학교 전산정보학과)
Yoon, Hee-Byung (국방대학교 전산정보학과)
Publication Information
The KIPS Transactions:PartD / v.13D, no.7, 2006 , pp. 923-930 More about this Journal
Abstract
In this paper we design the system test model for the weapon system embedded software based on the Time Factor Method(TFM) considering time factors and suggest the results through the case study. For doing this, we discuss the features, system tests and the object-oriented model based UML notations of the weapon system embedded software. And we give a test method considering time factors, a measuring method to time factors, and a test case selection algorithm as an approach to the TFM for designing the system test model. The TFM based system test model consists of three factors (X, Y, Z) in the weapon system embedded software. With this model, we can extract test cases through the selection algorithm for a maximum time path in 'X', identify the objects related to the Sequence Diagram in 'Y' and measure the execution time of each objects which is identified by the Timing Diagram in 'Z' Also, we present the method of extracting the system test cases by applying the proposed system test model to the 'Multi-function missile defense system'.
Keywords
Time Factor Method; Object; Weapon System Embedded Software; Time Factor; System Test Model;
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