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http://dx.doi.org/10.3745/KIPSTD.2004.11D.6.1287

A Coverage-Based Software Reliability Growth Model for Imperfect Fault Detection and Repeated Construct Execution  

Park, Joong-Yang
Park, Jae-Heung
Kim, Young-Soon
Publication Information
The KIPS Transactions:PartD / v.11D, no.6, 2004 , pp. 1287-1294 More about this Journal
Abstract
Recently relationships between reliability measures and the coverage have been developed for evaluation of software reliability. Particularly the mean value function of the coverage-based software reliability growth model is important because of its key role in rep-resenting the software reliability growth. In this paper, we first review the problems of the existing mean value functions with respect to the assumptions on which they are based. Then a new mean value function is proposed. The new mean value function is developed for a general testing environment in which imperfect fault detection and repeated construct execution are allowed. Finally performance of the proposed model is empirically evaluated by applying it to a real data set.
Keywords
Software Reliability Growth Model; Mean Value Function; Construct; Uniform Testing; Imperfect Fault Detection;
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Times Cited By KSCI : 1  (Citation Analysis)
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