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http://dx.doi.org/10.3745/KIPSTD.2003.10D.4.709

Trigger design to software defect analysis  

Lee, Eun-Seo (중앙대학교 대학원 컴퓨터공학과)
Lee, Kyung-Whan (ISO/SC7/WG10 SPICE 한국위원)
Publication Information
The KIPS Transactions:PartD / v.10D, no.4, 2003 , pp. 709-718 More about this Journal
Abstract
This research introduces defect and its causes that happen on software development. Based on defect cause analysis, we understand associated relation between defects and them design defect trigger. So, when we achieve similar project, we can forecast defect and prepare to solve defect by using defect trigger.
Keywords
SPI; Defect Management; Defect Analysis; Defect Trigger; Project Management;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
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