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http://dx.doi.org/10.3745/KIPSTB.2010.17B.6.445

LCD BLU Defects Detection System with Sidelight  

Moon, Chang-Bae (금오공과대학교 컴퓨터공학부 소프트웨어공학과)
Bark, Jee-Woong ((주)유비젼 장비사업부)
Lee, Hae-Yeoun (국립금오공과대학교 컴퓨터공학부)
Kim, Byeong-Man (국립금오공과대학교 컴퓨터공학부)
Shin, Yoon-Sik (국립금오공과대학교 컴퓨터공학부)
Publication Information
The KIPS Transactions:PartB / v.17B, no.6, 2010 , pp. 445-458 More about this Journal
Abstract
A Cold Cathode Fluorescent Lamp(CCFL) is used as a LCD Monitor's backlight widely. The most common way to check CCFL's defects is an examination with the naked eye. This naked eye examination can cause examination inconsistencies and industrial disasters. A shooting environment and detection algorithms are important for finding CCFL defects automatically. This paper presents CCFL defect detection algorithms using images captured under the shooting environment with sidelight which is one of the shooting environment we have suggested. The experimental result shows 4.65% of overdetection and 5.37% of unsuccessful defect detection of CCFL.
Keywords
CCFL Fluorescent Substance; Shooting Environment; Defects Detection Algorithm;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
1 정운국, 문창배, 이해연, 김병만, 양한석 “CCFL 불량 판별을 위한 전처리 알고리즘” 한국정보과학회 2009 가을학술발표논문집 제36권 제2호(C), 2009. 11, pp.359-362.
2 최승태, 허윤, 이준형, 최태호, 강진규, 최유화 “ EEFL 불량검사를 위한 네트워크기반 멀티비젼 통합시스템 구현” 제어로봇시스템학회지 Vol.14, No.2, 2008년, pp.21-25.
3 문창배, 정운국, 이흥수, 이준영, 이해연, 김병만, 양한석, “CCFL 검사를 위한 촬영환경 및 불량판별 알고리즘”, 제33회 한국정보처리학회 춘계학술발표대회논문집 제17권 제1호 (2010. 4)
4 Jaythech Vision Light, http://www.jaytech.kr