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http://dx.doi.org/10.3745/KIPSTB.2006.13B.4.377

Template Check and Block Matching Method for Automatic Defects Detection of the Back Light Unit  

Han Chang-Ho (선문대학교 대학원 전자공학과)
Cho Sang-Hee (선문대학교 대학원 전자공학과)
Oh Choon-Suk (선문대학교 전자정보통신공학부)
Ryu Young-Kee (선문대학교 전자정보통신공학부)
Publication Information
The KIPS Transactions:PartB / v.13B, no.4, 2006 , pp. 377-382 More about this Journal
Abstract
In this paper, two methods based on the use of morphology and pattern matching prior to detect classified defects automatically on the back light unit which is a part of display equipments are proposed. One is the template check method which detects small size defects by using closing and opening method, and the other is the block matching method which detects big size defects by comparing with four regions of uniform blocks. The TC algorithm also can detect defects on the non-uniform pattern of BLU by using revised Otsu method. The proposed method has been implemented on the automatic defect detection system we developed and has been tested image data of BLU captured by the system.
Keywords
Machine vision; Image inspection; BLU; Morphology;
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Times Cited By KSCI : 1  (Citation Analysis)
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