Simulation Method based on Design Checkpoint for Efficient Debugging
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Shim, Kyu-Ho
(삼성전자 System LSI 사업부)
Kim, Nam-Do (삼성전자 System LSI 사업부) Park, In-Hag ((주)시스템센트로이드) Min, Byeong-Eon (삼성전자 System LSI 사업부) Yang, Sei-Yang (부산대학교 컴퓨터공학과) |
1 | Yu-Chin Hsu, "Maximizing Full-Chip Simulation Signal Visibility for Efficient Debug", International Symposium on VLSI Design, Automation and Test, pp.1-5, 2007. |
2 | Visibility Enhancement Technology for Simulation Whitepaper, Novas Software (http://www.springsoft.com), 2009 |
3 | Dusung Kim, Maciej Ciesielski, Kyuho Shim, and Seiyang Yang, "Temporal parallel simulation: A fast gate-level HDL simulation using higher level models", Proc. DATE Conference, March, pp.1584-1589, 2011. |
4 |
Making Hardware/Software Co-Verification Easier for ARM |
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6 | J. Marantz, "Enhanced Visibility and Performance in Functional Verification by Reconstruction" Proc. 35th Design Automation Conference, pp.164-169, June, 1998. |
7 | B. Wile, J. Goss, and W. Roesner, Comprehensive Functional Verification: The Complete Industry Cycle (Systems on Silicon) , Elsevier, June, 2005. |
8 | Kyuho Shim, Youngrae Cho, Namdo Kim, Hyuncheol Baik, Kyungkuk Kim, Dusung Kim, Jaebum Kim, Byeongun Min, Kyumyung Choi, Maciej Ciesielski, and Seiyang Yang, "A Fast Two-pass HDL Simulation with On-Demand Dump", Asia and South Pacific Design Automation Conference, 2008. pp.422-427, 2008. |
9 | Namdo Kim, Junhyuk Park, Byeong Min, K.M. Choi, Kyuho Shim and Seiyang Yang, "Smart Debugging Strategy for Billion-Gate SOCs", User Track, 47th Design Automation Conference, June, 2010. |
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